György Nádudvari

Person

Pilisszentivan, HU

People

Patents Grantslast 30 patents

Information Patent Grant
Micro photoluminescence imaging
- Patent number 10,883,941
- Issue date Jan 5, 2021
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Zoltan Tamas Kiss
- G01 - MEASURING TESTING
Information Patent Grant
Micro photoluminescence imaging with optical filtering
- Patent number 10,209,190
- Issue date Feb 19, 2019
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Zoltan Tamas Kiss
- G01 - MEASURING TESTING
Information Patent Grant
Micro photoluminescence imaging with optical filtering
- Patent number 10,018,565
- Issue date Jul 10, 2018
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Zoltan Tamas Kiss
- G01 - MEASURING TESTING
Information Patent Grant
Micro photoluminescence imaging
- Patent number 10,012,593
- Issue date Jul 3, 2018
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Zoltan Tamas Kiss
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Photoluminescence mapping of passivation defects for silicon photov...
- Patent number 9,685,906
- Issue date Jun 20, 2017
- Semilab SDI LLC
- Jacek Lagowski
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR DETERMINING CRYSTAL DEFECT CONCENTRATION LOWER THAN 10 P...
- Publication number 20250044239
- Publication date Feb 6, 2025
- SEMILAB Zrt.
- Zsolt ZOLNAI
- G01 - MEASURING TESTING
Information Patent Application
PHOTOLUMINESCENT IMAGING OF SEMICONDUCTOR SAMPLES
- Publication number 20240280473
- Publication date Aug 22, 2024
- Zoltán Tamás KISS
- G01 - MEASURING TESTING
Information Patent Application
MICRO PHOTOLUMINESCENCE IMAGING
- Publication number 20200300767
- Publication date Sep 24, 2020
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Zoltan Tamas Kiss
- G01 - MEASURING TESTING
Information Patent Application
Micro Photoluminescence Imaging
- Publication number 20190391079
- Publication date Dec 26, 2019
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Zoltan Tamas Kiss
- G01 - MEASURING TESTING
Information Patent Application
MICRO PHOTOLUMINESCENCE IMAGING WITH OPTICAL FILTERING
- Publication number 20180313761
- Publication date Nov 1, 2018
- Zoltan Tamas Kiss
- G01 - MEASURING TESTING
Information Patent Application
MICRO PHOTOLUMINESCENCE IMAGING WITH OPTICAL FILTERING
- Publication number 20160327485
- Publication date Nov 10, 2016
- Semilab SDI LLC
- Zoltan Tamas Kiss
- G01 - MEASURING TESTING
Information Patent Application
Micro Photoluminescence Imaging
- Publication number 20160328840
- Publication date Nov 10, 2016
- Semilab SDI LLC
- Zoltan Tamas Kiss
- G01 - MEASURING TESTING
Information Patent Application
PHOTOLUMINESCENCE MAPPING OF PASSIVATION DEFECTS FOR SILICON PHOTOV...
- Publication number 20150008952
- Publication date Jan 8, 2015
- Semilab SDI LLC
- Jacek Lagowski
- G01 - MEASURING TESTING

György Nádudvari

Person

Patents Grantslast 30 patents

Micro photoluminescence imaging

Micro photoluminescence imaging with optical filtering

Micro photoluminescence imaging with optical filtering

Micro photoluminescence imaging

Photoluminescence mapping of passivation defects for silicon photov...

Patents Applicationslast 30 patents

METHOD FOR DETERMINING CRYSTAL DEFECT CONCENTRATION LOWER THAN 10 P...

PHOTOLUMINESCENT IMAGING OF SEMICONDUCTOR SAMPLES

MICRO PHOTOLUMINESCENCE IMAGING

Micro Photoluminescence Imaging

MICRO PHOTOLUMINESCENCE IMAGING WITH OPTICAL FILTERING

MICRO PHOTOLUMINESCENCE IMAGING WITH OPTICAL FILTERING

Micro Photoluminescence Imaging

PHOTOLUMINESCENCE MAPPING OF PASSIVATION DEFECTS FOR SILICON PHOTOV...