Gyung-Su Byun

Person

Seoul, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor driver circuit with signal swing balance and enhanced...
- Patent number 7,598,762
- Issue date Oct 6, 2009
- Samsung Electronics Co., Ltd.
- Gyung-Su Byun
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device including duty cycle correction circuit
- Patent number 7,292,499
- Issue date Nov 6, 2007
- Samsung Electronics Co., Ltd.
- Gyung-su Byun
- G11 - INFORMATION STORAGE
Information Patent Grant
Differential output driver and semiconductor device having the same
- Patent number 7,288,967
- Issue date Oct 30, 2007
- Samsung Electronics Co., Ltd.
- Gyung-Su Byun
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Layout structure of signal driver
- Patent number 7,274,259
- Issue date Sep 25, 2007
- Samsung Electronics Co., Ltd.
- Gyung-Su Byun
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Delay locked loop capable of performing reliable locking operation
- Patent number 7,190,200
- Issue date Mar 13, 2007
- Samsung Electronics Co., Ltd.
- Gyung-Su Byun
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor device having delay-locked loop and test method thereof
- Patent number 7,123,540
- Issue date Oct 17, 2006
- Samsung Electronics Co., Ltd.
- Gyung-Su Byun
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Delay locked loop capable of compensating for delay of internal clo...
- Patent number 7,068,084
- Issue date Jun 27, 2006
- Samsung Electronics, Co., Ltd.
- Gyung-su Byun
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor memory devices and a method thereof
- Publication number 20070047347
- Publication date Mar 1, 2007
- SAMSUNG ELECTRONICS CO., LTD.
- Gyung-Su Byun
- G11 - INFORMATION STORAGE
Information Patent Application
Differential output driver and semiconductor device having the same
- Publication number 20060214689
- Publication date Sep 28, 2006
- Gyung-Su Byun
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Semiconductor driver circuit with signal swing balance and enhanced...
- Publication number 20060126403
- Publication date Jun 15, 2006
- Gyung-Su Byun
- G11 - INFORMATION STORAGE
Information Patent Application
Layout structure of signal driver
- Publication number 20060119432
- Publication date Jun 8, 2006
- Samsung Electronics Co., Ltd.
- Gyung-Su Byun
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Delay locked loop capable of performing reliable locking operation
- Publication number 20050110542
- Publication date May 26, 2005
- SAMSUNG ELECTRONICS CO., LTD.
- Gyung-Su Byun
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Semiconductor device having delay-locked loop and test method thereof
- Publication number 20040227550
- Publication date Nov 18, 2004
- Gyung-Su Byun
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Delay locked loop capable of compensating for delay of internal clo...
- Publication number 20040124896
- Publication date Jul 1, 2004
- SAMSUNG ELECTRONICS CO., LTD.
- Gyung-su Byun
- H03 - BASIC ELECTRONIC CIRCUITRY

Gyung-Su Byun

Person

Patents Grantslast 30 patents

Semiconductor driver circuit with signal swing balance and enhanced...

Semiconductor device including duty cycle correction circuit

Differential output driver and semiconductor device having the same

Layout structure of signal driver

Delay locked loop capable of performing reliable locking operation

Semiconductor device having delay-locked loop and test method thereof

Delay locked loop capable of compensating for delay of internal clo...

Patents Applicationslast 30 patents

Semiconductor memory devices and a method thereof

Differential output driver and semiconductor device having the same

Semiconductor driver circuit with signal swing balance and enhanced...

Layout structure of signal driver

Delay locked loop capable of performing reliable locking operation

Semiconductor device having delay-locked loop and test method thereof

Delay locked loop capable of compensating for delay of internal clo...