Gyuyeol KIM

Person

Hwaseong-si, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Probe for testing a semiconductor device and a probe card including...
- Patent number 12,038,458
- Issue date Jul 16, 2024
- Samsung Electronics Co., Ltd.
- Sung Hoon Lee
- G01 - MEASURING TESTING
Information Patent Grant
Fan-out buffer with skew control function, operating method thereof...
- Patent number 11,921,158
- Issue date Mar 5, 2024
- Samsung Electronics Co., Ltd.
- Byung-Sung Kim
- G01 - MEASURING TESTING
Information Patent Grant
Stiffener having an elastic portion
- Patent number 11,378,586
- Issue date Jul 5, 2022
- Samsung Electronics Co., Ltd.
- Joonsu Ji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe cards, system for manufacturing semiconductor device, and met...
- Patent number 11,327,095
- Issue date May 10, 2022
- Samsung Electronics Co., Ltd.
- Sungho Joo
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatuses including probe card for testing semiconductor dev...
- Patent number 11,243,232
- Issue date Feb 8, 2022
- Samsung Electronics Co., Ltd.
- Gyuyeol Kim
- G01 - MEASURING TESTING
Information Patent Grant
Test system for measuring propagation delay time of transmission line
- Patent number 10,304,708
- Issue date May 28, 2019
- Samsung Electronics Co., Ltd.
- Gyuyeol Kim
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
TEST DEVICE AND TEST METHOD IMPLEMENTING THE SAME
- Publication number 20240310439
- Publication date Sep 19, 2024
- Samsung Electronics Co., Ltd.
- Gyuyeol KIM
- G01 - MEASURING TESTING
Information Patent Application
FAN-OUT BUFFER WITH SKEW CONTROL FUNCTION, OPERATING METHOD THEREOF...
- Publication number 20230333160
- Publication date Oct 19, 2023
- Samsung Electronics Co., Ltd.
- BYUNG-SUNG KIM
- G01 - MEASURING TESTING
Information Patent Application
PROBE FOR TESTING A SEMICONDUCTOR DEVICE AND A PROBE CARD INCLUDING...
- Publication number 20220308088
- Publication date Sep 29, 2022
- Korea Instrument Co.,Ltd.
- SUNG HOON LEE
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARDS, SYSTEM FOR MANUFACTURING SEMICONDUCTOR DEVICE, AND MET...
- Publication number 20210055328
- Publication date Feb 25, 2021
- Samsung Electronics Co., Ltd.
- Sungho JOO
- G01 - MEASURING TESTING
Information Patent Application
STIFFENER HAVING AN ELASTIC PORTION
- Publication number 20210041479
- Publication date Feb 11, 2021
- Samsung Electronics Co., Ltd.
- Joonsu JI
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUSES INCLUDING PROBE CARD FOR TESTING SEMICONDUCTOR DEV...
- Publication number 20200386786
- Publication date Dec 10, 2020
- Samsung Electronics Co., Ltd.
- Gyuyeol KIM
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM FOR MEASURING PROPAGATION DELAY TIME OF TRANSMISSION LINE
- Publication number 20180122666
- Publication date May 3, 2018
- Samsung Electronics Co., Ltd.
- Gyuyeol KIM
- G01 - MEASURING TESTING

Gyuyeol KIM

Person

Patents Grantslast 30 patents

Probe for testing a semiconductor device and a probe card including...

Fan-out buffer with skew control function, operating method thereof...

Stiffener having an elastic portion

Probe cards, system for manufacturing semiconductor device, and met...

Test apparatuses including probe card for testing semiconductor dev...

Test system for measuring propagation delay time of transmission line

Patents Applicationslast 30 patents

TEST DEVICE AND TEST METHOD IMPLEMENTING THE SAME

FAN-OUT BUFFER WITH SKEW CONTROL FUNCTION, OPERATING METHOD THEREOF...

PROBE FOR TESTING A SEMICONDUCTOR DEVICE AND A PROBE CARD INCLUDING...

PROBE CARDS, SYSTEM FOR MANUFACTURING SEMICONDUCTOR DEVICE, AND MET...

STIFFENER HAVING AN ELASTIC PORTION

TEST APPARATUSES INCLUDING PROBE CARD FOR TESTING SEMICONDUCTOR DEV...

TEST SYSTEM FOR MEASURING PROPAGATION DELAY TIME OF TRANSMISSION LINE