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H. Alan Mantooth
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Fayetteville, AR, US
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Patents Grants
last 30 patents
Information
Patent Grant
Intelligent multi-level voltage gate driving system for semiconduct...
Patent number
11,728,808
Issue date
Aug 15, 2023
H. Alan Mantooth
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
High temperature optoelectronic devices for power electronics
Patent number
11,329,209
Issue date
May 10, 2022
Zhong Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Intelligent multi-level voltage gate driving system for semiconduct...
Patent number
11,277,127
Issue date
Mar 15, 2022
H. Alan Mantooth
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Micro-hall effect devices for simultaneous current and temperature...
Patent number
11,137,310
Issue date
Oct 5, 2021
Thomas P. White
G01 - MEASURING TESTING
Information
Patent Grant
Circuit and method for fault detection and reconfiguration in casca...
Patent number
10,790,738
Issue date
Sep 29, 2020
Haider Mhiesan
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Flip-chip wire bondless power device
Patent number
10,720,380
Issue date
Jul 21, 2020
Sayan Seal
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for modeling and parameter extraction of LDMOS devices
Patent number
8,608,376
Issue date
Dec 17, 2013
Board of Trustees of the University of Arkansas
Avinash S. Kashyap
G01 - MEASURING TESTING
Information
Patent Grant
Component-based analog and mixed-signal simulation model developmen...
Patent number
6,236,956
Issue date
May 22, 2001
Avant! Corporation
H. Alan Mantooth
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
ADAPTIVE SILICON CARBIDE GATE DRIVERS IN INTEGRATED CIRCUIT FORM
Publication number
20240072637
Publication date
Feb 29, 2024
BOARD OFTRUSTEES OF THE UNIVERSITY OF ARKANSAS
Xia Du
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
Dual mode technique based on Hall effect and induction for magnetic...
Publication number
20230341483
Publication date
Oct 26, 2023
Anand Vikas Lalwani
G01 - MEASURING TESTING
Information
Patent Application
MICRO-HALL EFFECT DEVICES FOR SIMULTANEOUS CURRENT AND TEMPERATURE...
Publication number
20190120712
Publication date
Apr 25, 2019
Thomas P. White
G01 - MEASURING TESTING
Information
Patent Application
Method for modeling and parameter extraction of LDMOS devices
Publication number
20110292964
Publication date
Dec 1, 2011
Avinash S. Kashyap
G01 - MEASURING TESTING