H. E. Waldenmaier

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White Plains, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Surveillance system
- Patent number 5,774,569
- Issue date Jun 30, 1998
- H. Eugene W. Waldenmaier
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical thickness profiler using synthetic wavelengths
- Patent number 5,159,408
- Issue date Oct 27, 1992
- Hughes Danbury Optical Systems, Inc.
- H. E. Waldenmaier
- G01 - MEASURING TESTING