H. Scott Fetterman

Person

New Tripoli, PA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Stress migration test structure and method therefor
- Patent number 6,747,445
- Issue date Jun 8, 2004
- Agere Systems Inc.
- H. Scott Fetterman
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit having stress migration test structure and metho...
- Patent number 6,683,465
- Issue date Jan 27, 2004
- Agere Systems Inc.
- H. Scott Fetterman
- G01 - MEASURING TESTING
Information Patent Grant
Multistage analog-to-digital converter with amplifier component swa...
- Patent number 6,515,611
- Issue date Feb 4, 2003
- Agere Systems Inc.
- H. Scott Fetterman
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Multistage converter employing digital dither
- Patent number 6,404,364
- Issue date Jun 11, 2002
- Agere Systems Guardian Corp.
- H. Scott Fetterman
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Clock doubler circuit with RC-CR phase shifter network
- Patent number 6,369,622
- Issue date Apr 9, 2002
- Agere Systems Guardian Corp.
- Lysander B. Lim
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Multistage analog-to-digital converter employing dither
- Patent number 6,172,629
- Issue date Jan 9, 2001
- Lucent Technologies Inc.
- H. Scott Fetterman
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and apparatus for controlling the common-mode output voltage...
- Patent number 5,939,904
- Issue date Aug 17, 1999
- Lucent Technologies, Inc.
- H. Scott Fetterman
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Text fixture retainer for an integrated circuit package
- Patent number 5,936,849
- Issue date Aug 10, 1999
- Lucent Technologies Inc.
- H. Scott Fetterman
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Enforcement of permitted cell phone usage
- Publication number 20060019645
- Publication date Jan 26, 2006
- Kouros Azimi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Integrated circuit having stress migration test structure and metho...
- Publication number 20030080766
- Publication date May 1, 2003
- H. Scott Fetterman
- G01 - MEASURING TESTING
Information Patent Application
Stress migration test structure and method therefor
- Publication number 20030082836
- Publication date May 1, 2003
- H. Scott Fetterman
- G01 - MEASURING TESTING

H. Scott Fetterman

Person

Patents Grantslast 30 patents

Stress migration test structure and method therefor

Integrated circuit having stress migration test structure and metho...

Multistage analog-to-digital converter with amplifier component swa...

Multistage converter employing digital dither

Clock doubler circuit with RC-CR phase shifter network

Multistage analog-to-digital converter employing dither

Method and apparatus for controlling the common-mode output voltage...

Text fixture retainer for an integrated circuit package

Patents Applicationslast 30 patents

Enforcement of permitted cell phone usage

Integrated circuit having stress migration test structure and metho...

Stress migration test structure and method therefor