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Habib Kilicaslan
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Chandler, AZ, US
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Patents Grants
last 30 patents
Information
Patent Grant
Dual tip test probe assembly
Patent number
8,026,734
Issue date
Sep 27, 2011
SV Probe Pte. Ltd.
Son Ngoc Dang
G01 - MEASURING TESTING
Information
Patent Grant
Probe card assembly and method of attaching probes to the probe car...
Patent number
7,675,302
Issue date
Mar 9, 2010
SV Probe Pte. Ltd.
Bahadir Tunaboylu
G01 - MEASURING TESTING
Information
Patent Grant
Probe card assembly with a dielectric strip structure coupled to a...
Patent number
7,495,459
Issue date
Feb 24, 2009
SV Probe Pte. Ltd.
Bahadir Tunaboylu
G01 - MEASURING TESTING
Information
Patent Grant
Blade probe and blade probe card
Patent number
7,432,728
Issue date
Oct 7, 2008
SV Probe Pte. Ltd.
Habib Kilicaslan
G01 - MEASURING TESTING
Information
Patent Grant
Probe card assembly with dielectric structure
Patent number
7,279,911
Issue date
Oct 9, 2007
SV Probe Pte. Ltd.
Bahadir Tunaboylu
G01 - MEASURING TESTING
Information
Patent Grant
Probe card assembly and method of attaching probes to the probe car...
Patent number
7,271,602
Issue date
Sep 18, 2007
SV Probe Pte. Ltd.
Bahadir Tunaboylu
G01 - MEASURING TESTING
Information
Patent Grant
Device having battery-save circuitry and method of operation
Patent number
6,246,213
Issue date
Jun 12, 2001
Motorola, Inc.
Richard B. Meador
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
Dual Tip Test Probe Assembly
Publication number
20100327894
Publication date
Dec 30, 2010
Son Ngoc Dang
G01 - MEASURING TESTING
Information
Patent Application
PROBE CARD ASSEMBLY WITH A DIELECTRIC STRIP STRUCTURE
Publication number
20080024148
Publication date
Jan 31, 2008
Bahadir Tunaboylu
G01 - MEASURING TESTING
Information
Patent Application
Probe Card Assembly and Method of Attaching Probes to the Probe Car...
Publication number
20070279076
Publication date
Dec 6, 2007
Bahadir Tunaboylu
G01 - MEASURING TESTING
Information
Patent Application
Blade probe and blade probe card
Publication number
20070210815
Publication date
Sep 13, 2007
Habib Kilicaslan
G01 - MEASURING TESTING
Information
Patent Application
Probe card assembly with dielectric structure
Publication number
20060250150
Publication date
Nov 9, 2006
K&S Interconnect, Inc.
Bahadir Tunaboylu
G01 - MEASURING TESTING
Information
Patent Application
Probe card assembly and method of attaching probes to the probe car...
Publication number
20060181292
Publication date
Aug 17, 2006
K&S Interconnect, Inc.
Bahadir Tunaboylu
G01 - MEASURING TESTING