Habib Najm

Person

Dallas, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Liquid cooled light pipe assembly for pyrometric temperature measur...
- Patent number 6,122,041
- Issue date Sep 19, 2000
- Texas Instruments Incorporated
- Habib Najm
- G01 - MEASURING TESTING
Information Patent Grant
Multi-point semiconductor wafer fabrication process temperature con...
- Patent number 5,508,934
- Issue date Apr 16, 1996
- Texas Instruments Incorporated
- Mehrdad M. Moslehi
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for low-temperature semiconductor processing
- Patent number 5,435,379
- Issue date Jul 25, 1995
- Texas Instruments Incorporated
- Mehrdad M. Moslehi
- F04 - POSITIVE DISPLACEMENT MACHINES FOR LIQUIDS PUMPS FOR LIQUIDS OR ELASTIC...
Information Patent Grant
Semiconductor wafer heater with infrared lamp module with light blo...
- Patent number 5,345,534
- Issue date Sep 6, 1994
- Texas Instruments Incorporated
- Habib N. Najm
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wireless temperature calibration device and method
- Patent number 5,326,170
- Issue date Jul 5, 1994
- Texas Instruments, Incorporated
- Mehrdad M. Moslehi
- G01 - MEASURING TESTING
Information Patent Grant
Fiber optic network for multi-point emissivity-compensated semicond...
- Patent number 5,317,656
- Issue date May 31, 1994
- Texas Instruments Incorporated
- Mehrdad M. Moslehi
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for determining wafer temperature using pyrometry
- Patent number 5,305,417
- Issue date Apr 19, 1994
- Texas Instruments Incorporated
- Habib N. Najm
- C30 - CRYSTAL GROWTH
Information Patent Grant
Wireless temperature calibration device and method
- Patent number 5,265,957
- Issue date Nov 30, 1993
- Texas Instruments Incorporated
- Mehrdad M. Moslehi
- G01 - MEASURING TESTING
Information Patent Grant
Multi-point pyrometry with real-time surface emissivity compensation
- Patent number 5,255,286
- Issue date Oct 19, 1993
- Texas Instruments Incorporated
- Mehrdad M. Moslehi
- G01 - MEASURING TESTING
Information Patent Grant
Multi-point pyrometry with real-time surface emissivity compensation
- Patent number 5,156,461
- Issue date Oct 20, 1992
- Texas Instruments Incorporated
- Mehrdad M. Moslehi
- G01 - MEASURING TESTING
Information Patent Grant
Coupling device for providing electrical and thermal insulation und...
- Patent number 5,139,288
- Issue date Aug 18, 1992
- Texas Instruments Incorporated
- Habib Najm
- F17 - STORING OF DISTRIBUTING GASES OR LIQUIDS

Person

Patents Grantslast 30 patents

Liquid cooled light pipe assembly for pyrometric temperature measur...

Multi-point semiconductor wafer fabrication process temperature con...

Method and apparatus for low-temperature semiconductor processing

Semiconductor wafer heater with infrared lamp module with light blo...

Wireless temperature calibration device and method

Fiber optic network for multi-point emissivity-compensated semicond...

Apparatus and method for determining wafer temperature using pyrometry

Wireless temperature calibration device and method

Multi-point pyrometry with real-time surface emissivity compensation

Multi-point pyrometry with real-time surface emissivity compensation

Coupling device for providing electrical and thermal insulation und...