Membership
Tour
Register
Log in
Hachiro Hiratsuka
Follow
Person
Yokohama, JP
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Semiconductor substrate, method of manufacturing semiconductor subs...
Patent number
5,508,800
Issue date
Apr 16, 1996
Kabushiki Kaisha Toshiba
Moriya Miyashita
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for detecting defect on semiconductor substrat...
Patent number
5,271,796
Issue date
Dec 21, 1993
Kabushiki Kaisha Toshiba
Moriya Miyashita
C30 - CRYSTAL GROWTH
Information
Patent Grant
Insulation film for a semiconductor device
Patent number
4,837,610
Issue date
Jun 6, 1989
Kabushiki Kaisha Toshiba
Hachiro Hiratsuka
H01 - BASIC ELECTRIC ELEMENTS