Haejung CHOI

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Daegu, KR

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Patents Grantslast 30 patents

Information Patent Grant
Supply voltage detecting circuit, method of operating the same, ele...
- Patent number 11,650,232
- Issue date May 16, 2023
- Samsung Electronics Co., Ltd.
- Cheolhwan Lim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Voltage monitoring device and electronic device including the same
- Patent number 11,467,195
- Issue date Oct 11, 2022
- Samsung Electronics Co., Ltd.
- Cheolhwan Lim
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Supply voltage detecting circuit, method of operating the same, ele...
- Patent number 11,397,199
- Issue date Jul 26, 2022
- Samsung Electronics Co., Ltd.
- Cheolhwan Lim
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
CLOCK MONITORING CIRCUIT
- Publication number 20240183901
- Publication date Jun 6, 2024
- Samsung Electronics Co., Ltd.
- Haejung CHOI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEMPERATURE SENSOR CAPABLE OF DETERMINING WHETHER TO CONVERT REFERE...
- Publication number 20230273073
- Publication date Aug 31, 2023
- Samsung Electronics Co., Ltd.
- HAEJUNG CHOI
- G01 - MEASURING TESTING
Information Patent Application
LASER DETECTING CIRCUIT AND SEMICONDUCTOR APPARATUS INCLUDING THE SAME
- Publication number 20230020463
- Publication date Jan 19, 2023
- Samsung Electronics Co., Ltd.
- Cheolhwan LIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUPPLY VOLTAGE DETECTING CIRCUIT, METHOD OF OPERATING THE SAME, ELE...
- Publication number 20220357372
- Publication date Nov 10, 2022
- Samsung Electronics Co., Ltd.
- Cheolhwan LIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SUPPLY VOLTAGE DETECTING CIRCUIT, METHOD OF OPERATING THE SAME, ELE...
- Publication number 20210239744
- Publication date Aug 5, 2021
- Samsung Electronics Co., Ltd.
- Cheolhwan LIM
- G01 - MEASURING TESTING
Information Patent Application
VOLTAGE MONITORING DEVICE AND ELECTRONIC DEVICE INCLUDING THE SAME
- Publication number 20200386796
- Publication date Dec 10, 2020
- Samsung Electronics Co., Ltd.
- Cheolhwan LIM
- G01 - MEASURING TESTING