Haewook Han

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Pohang, KR

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Patents Grantslast 30 patents

Information Patent Grant
Field induced THz wave emission microscope
- Patent number 7,230,245
- Issue date Jun 12, 2007
- Rensselaer Polytechnic Institute
- Xi-Cheng Zhang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Field induced THz wave emission microscope
- Publication number 20060022141
- Publication date Feb 2, 2006
- Xi-Cheng Zhang
- G01 - MEASURING TESTING