Hagai COHEN

Person

Rehovot, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Nanostructures, their use and process for their production
- Patent number 9,496,067
- Issue date Nov 15, 2016
- Yeda Research and Development Co. Ltd.
- Reshef Tenne
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Fullerene-like nanostructures, their use and process for their prod...
- Patent number 8,518,364
- Issue date Aug 27, 2013
- Yeda Research and Development Company Ltd.
- Reshef Tenne
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and system for determining depth profiling
- Patent number 8,507,853
- Issue date Aug 13, 2013
- Yeda Research and Development Company Ltd.
- Hagai Cohen
- G01 - MEASURING TESTING
Information Patent Grant
Fullerene-like nanostructures, their use and process for their prod...
- Patent number 8,329,138
- Issue date Dec 11, 2012
- Yeda Research and Development Company Ltd.
- Reshef Tenne
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Electrical measurements in samples
- Patent number 7,148,478
- Issue date Dec 12, 2006
- Yeda Research and Development Company Ltd.
- Hagai Cohen
- G01 - MEASURING TESTING
Information Patent Grant
Electron spectroscopy employing controlled surface charging
- Patent number 6,720,556
- Issue date Apr 13, 2004
- Yeda Research and Development Co. Ltd.
- Hagai Cohen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ELECTRON SPECTROSCOPY BASED TECHNIQUES FOR DETERMINING VARIOUS CHEM...
- Publication number 20230288355
- Publication date Sep 14, 2023
- COZAI LTD
- Hagai COHEN
- G01 - MEASURING TESTING
Information Patent Application
WORK FUNCTION MEASUREMENTS FOR SURFACE ANALYSIS
- Publication number 20230243766
- Publication date Aug 3, 2023
- COZAI LTD
- Hagai COHEN
- G01 - MEASURING TESTING
Information Patent Application
FULLERENE-LIKE NANOSTRUCTURES, THEIR USE AND PROCESS FOR THEIR PROD...
- Publication number 20130109601
- Publication date May 2, 2013
- Yeda Research and Development Company Ltd.
- Reshef TENNE
- B82 - NANO-TECHNOLOGY
Information Patent Application
NANOSTRUCTURES, THEIR USE AND PROCESS FOR THEIR PRODUCTION
- Publication number 20120329686
- Publication date Dec 27, 2012
- Reshef Tenne
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHOD AND SYSTEM FOR DETERMINING DEPTH PROFILING
- Publication number 20110210246
- Publication date Sep 1, 2011
- Yeda Research and Development Company Ltd.
- Hagai COHEN
- G01 - MEASURING TESTING
Information Patent Application
FULLERENE-LIKE NANOSTRUCTURES, THEIR USE AND PROCESS FOR THEIR PROD...
- Publication number 20100227782
- Publication date Sep 9, 2010
- Yeda Research and Development Company Ltd.
- Reshef TENNE
- B82 - NANO-TECHNOLOGY
Information Patent Application
Electrical measurements in samples
- Publication number 20060103395
- Publication date May 18, 2006
- Hagai Cohen
- G01 - MEASURING TESTING
Information Patent Application
Electron spectroscopy employing controlled surface charging
- Publication number 20020020814
- Publication date Feb 21, 2002
- Hagai Cohen
- B82 - NANO-TECHNOLOGY

Hagai COHEN

Person

Patents Grantslast 30 patents

Nanostructures, their use and process for their production

Fullerene-like nanostructures, their use and process for their prod...

Method and system for determining depth profiling

Fullerene-like nanostructures, their use and process for their prod...

Electrical measurements in samples

Electron spectroscopy employing controlled surface charging

Patents Applicationslast 30 patents

ELECTRON SPECTROSCOPY BASED TECHNIQUES FOR DETERMINING VARIOUS CHEM...

WORK FUNCTION MEASUREMENTS FOR SURFACE ANALYSIS

FULLERENE-LIKE NANOSTRUCTURES, THEIR USE AND PROCESS FOR THEIR PROD...

NANOSTRUCTURES, THEIR USE AND PROCESS FOR THEIR PRODUCTION

METHOD AND SYSTEM FOR DETERMINING DEPTH PROFILING

FULLERENE-LIKE NANOSTRUCTURES, THEIR USE AND PROCESS FOR THEIR PROD...

Electrical measurements in samples

Electron spectroscopy employing controlled surface charging