Hai JIANG

Follow

Person

Panorama City, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Contour-based defect detection using an inspection apparatus
- Patent number 8,669,523
- Issue date Mar 11, 2014
- KLA-Tencor Corporation
- Chien-Huei Chen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CONTOUR-BASED DEFECT DETECTION USING AN INSPECTION APPARATUS
- Publication number 20120298862
- Publication date Nov 29, 2012
- Chien-Huei CHEN
- G06 - COMPUTING CALCULATING COUNTING