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Hai Lin
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Rancho Cucamonga, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Method and system for particle characterization and identification
Patent number
11,237,089
Issue date
Feb 1, 2022
Hal Technology, LLC
Hai Lin
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for emissions measurement
Patent number
10,627,343
Issue date
Apr 21, 2020
Hal Technology, LLC
Hai Lin
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for particle characterization in harsh environments
Patent number
10,359,350
Issue date
Jul 23, 2019
Hai Lin
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Method and system for particle characterization and identification
Publication number
20200256777
Publication date
Aug 13, 2020
Hal Technology, LLC
Hai Lin
G01 - MEASURING TESTING
Information
Patent Application
Method and system for emissions measurement
Publication number
20190302011
Publication date
Oct 3, 2019
Hal Technology, LLC
Hai Lin
G01 - MEASURING TESTING
Information
Patent Application
Method and system for particle characterization in harsh environments
Publication number
20190226965
Publication date
Jul 25, 2019
Hal Technology, LLC
Hai Lin
G01 - MEASURING TESTING