Hai-Yang You

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Shanghai, CN

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Patents Grantslast 30 patents

Information Patent Grant
Reflective compact lens for magneto-optic Kerr effect metrology system
- Patent number 12,164,093
- Issue date Dec 10, 2024
- Alex Zheng
- G02 - OPTICS
Information Patent Grant
Cantilever-type probe with multiple metallic coatings
- Patent number 11,543,431
- Issue date Jan 3, 2023
- KLA Corporation
- Hongshuo Zou
- G01 - MEASURING TESTING
Information Patent Grant
Magneto-optic Kerr effect metrology systems
- Patent number 11,043,239
- Issue date Jun 22, 2021
- KLA Corporation
- Jun Wang
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Cantilever-Type Probe with Multiple Metallic Coatings
- Publication number 20220214375
- Publication date Jul 7, 2022
- KLA Corporation
- Hongshuo Zou
- G01 - MEASURING TESTING
Information Patent Application
REFLECTIVE COMPACT LENS FOR MAGNETO-OPTIC KERR EFFECT METROLOGY SYSTEM
- Publication number 20220137380
- Publication date May 5, 2022
- KLA Corporation
- Alex ZHENG
- G02 - OPTICS
Information Patent Application
Cantilever-Type Probe with Multiple Metallic Coatings
- Publication number 20210333307
- Publication date Oct 28, 2021
- KLA Corporation
- Hongshuo Zou
- G01 - MEASURING TESTING
Information Patent Application
MAGNETO-OPTIC KERR EFFECT METROLOGY SYSTEMS
- Publication number 20200302965
- Publication date Sep 24, 2020
- KLA Corporation
- Jun Wang
- G11 - INFORMATION STORAGE