Membership
Tour
Register
Log in
Haibo CHEN
Follow
Person
Hefei City, CN
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Semiconductor testing structure and method for forming same
Patent number
11,984,370
Issue date
May 14, 2024
CHANGXIN MEMORY TECHNOLOGIES, INC.
Xiangyu Wang
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
SEMICONDUCTOR STRUCTURE AND METHOD FOR FORMING SAME
Publication number
20230019366
Publication date
Jan 19, 2023
CHANGXIN MEMORY TECHNOLOGIES, INC.
Haibo CHEN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR TESTING STRUCTURE AND METHOD FOR FORMING SAME
Publication number
20230008265
Publication date
Jan 12, 2023
CHANGXIN MEMORY TECHNOLOGIES, INC
Xiangyu WANG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR DEVICE LAYOUT STRUCTURE AND METHOD OF FORMING SEMICON...
Publication number
20230009090
Publication date
Jan 12, 2023
CHANGXIN MEMORY TECHNOLOGIES, INC.
Haibo CHEN
H01 - BASIC ELECTRIC ELEMENTS