Haifeng Wang

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Patents Grantslast 30 patents

Information Patent Grant
Multimodal platform for nonlinear optical microscopy and microspect...
- Patent number 8,994,932
- Issue date Mar 31, 2015
- Purdue Research Foundation
- Ji-Xin Cheng
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ANGULAR AVERAGING CALIBRATION ON BARE WAFER METROLOGY TOOLS FOR ESF...
- Publication number 20240353219
- Publication date Oct 24, 2024
- KLA Corporation
- Haifeng Wang
- G01 - MEASURING TESTING
Information Patent Application
MULTIMODAL PLATFORM FOR NONLINEAR OPTICAL MICROSCOPY AND MICROSPECT...
- Publication number 20110261349
- Publication date Oct 27, 2011
- Ji-Xin Cheng
- G02 - OPTICS