Haijiang WANG

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Shanghai, CN

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for measuring amplitude of scanning reflector
- Patent number 10,942,063
- Issue date Mar 9, 2021
- SHANGHAI MICRO ELECTRONICS EQUIPMENT (GROUP) CO., LTD.
- Xinghai Wang
- G01 - MEASURING TESTING
Information Patent Grant
Scan reflective mirror monitoring system and method, focusing and l...
- Patent number 10,394,142
- Issue date Aug 27, 2019
- SHANGHAI MICRO ELECTRONICS EQUIPMENT (GROUP) CO., LTD.
- Jiming Fan
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD FOR MEASURING AMPLITUDE OF SCANNING REFL...
- Publication number 20190310133
- Publication date Oct 10, 2019
- SHANGHAI MICRO ELECTRONICS EQUIPMENT (GROUP) CO., LTD.
- Xinghai WANG
- G02 - OPTICS
Information Patent Application
SCAN REFLECTIVE MIRROR MONITORING SYSTEM AND METHOD, FOCUSING AND L...
- Publication number 20190025718
- Publication date Jan 24, 2019
- SHANGHAI MICRO ELECTRONICS EQUIPMENT (GROUP) CO., LTD.
- Jiming FAN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY