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Shanghai, CN
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Patents Grants
last 30 patents
Information
Patent Grant
Magneto-optic Kerr effect metrology systems
Patent number
11,043,239
Issue date
Jun 22, 2021
KLA Corporation
Jun Wang
G11 - INFORMATION STORAGE
Information
Patent Grant
Variable spacing four-point probe pin device and method
Patent number
9,435,826
Issue date
Sep 6, 2016
KLA-Tencor Corporation
Walter H. Johnson
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
REFLECTIVE COMPACT LENS FOR MAGNETO-OPTIC KERR EFFECT METROLOGY SYSTEM
Publication number
20220137380
Publication date
May 5, 2022
KLA Corporation
Alex ZHENG
G02 - OPTICS
Information
Patent Application
MAGNETO-OPTIC KERR EFFECT METROLOGY SYSTEMS
Publication number
20200302965
Publication date
Sep 24, 2020
KLA Corporation
Jun Wang
G11 - INFORMATION STORAGE
Information
Patent Application
VARIABLE SPACING FOUR-POINT PROBE PIN DEVICE AND METHOD
Publication number
20130300445
Publication date
Nov 14, 2013
Walter H. Johnson
G01 - MEASURING TESTING