Haim Feldman

Person

Vol-Ayabon, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Multi-perspective wafer analysis
- Patent number 11,815,470
- Issue date Nov 14, 2023
- Applied Materials Israel, Ltd.
- Haim Feldman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for defect detection using multi-spot scanning
- Patent number 11,385,188
- Issue date Jul 12, 2022
- APPLIED MATERIAL ISRAEL, LTD.
- Amir Shoham
- G01 - MEASURING TESTING
Information Patent Grant
Inspection of a three dimensional structure of a sample using a pha...
- Patent number 11,270,432
- Issue date Mar 8, 2022
- Applied Materials Israel Ltd.
- Haim Feldman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Computerized system and method for obtaining information about a re...
- Patent number 10,902,582
- Issue date Jan 26, 2021
- Applied Materials Israel, Ltd.
- Haim Feldman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Asymmetrical magnification inspection system and illumination module
- Patent number 10,481,101
- Issue date Nov 19, 2019
- Applied Materials Israel Ltd.
- Haim Feldman
- G02 - OPTICS
Information Patent Grant
System and method for defect detection using multi-spot scanning
- Patent number 10,386,311
- Issue date Aug 20, 2019
- Applied Materials Israel, Ltd.
- Amir Shoham
- G01 - MEASURING TESTING
Information Patent Grant
Near-field sensor height control
- Patent number 10,060,736
- Issue date Aug 28, 2018
- Appled Materials Israel Ltd.
- Amir Moshe Sagiv
- G01 - MEASURING TESTING
Information Patent Grant
Evaluation system and a method for evaluating a substrate
- Patent number 9,835,563
- Issue date Dec 5, 2017
- Applied Materials Israel Ltd.
- Yoram Uziel
- G01 - MEASURING TESTING
Information Patent Grant
System and method for defect detection using multi-spot scanning
- Patent number 9,810,643
- Issue date Nov 7, 2017
- Applied Materials Israel Ltd.
- Amir Shoham
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for inspecting an object
- Patent number 9,535,014
- Issue date Jan 3, 2017
- Applied Materials Israel Ltd.
- Haim Feldman
- G02 - OPTICS
Information Patent Grant
On-tool wavefront aberrations measurement system and method
- Patent number 9,395,266
- Issue date Jul 19, 2016
- Applied Materials Israel Ltd.
- Boris Golberg
- G01 - MEASURING TESTING
Information Patent Grant
Inspection method and an inspection system exhibiting speckle reduc...
- Patent number 9,012,875
- Issue date Apr 21, 2015
- Applied Materials Israel, Ltd.
- Amir Shoham
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system and method for fast changes of focus
- Patent number 8,659,754
- Issue date Feb 25, 2014
- Applied Materials Israel, Ltd.
- Haim Feldman
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system and method for fast changes of focus
- Patent number 8,488,117
- Issue date Jul 16, 2013
- Applied Materials Israel, Ltd.
- Haim Feldman
- G01 - MEASURING TESTING
Information Patent Grant
Scanning microscopy using inhomogeneous polarization
- Patent number 8,228,601
- Issue date Jul 24, 2012
- Applied Materials Israel, Ltd.
- Doron Meshulach
- G02 - OPTICS
Information Patent Grant
Illumination system for optical inspection
- Patent number 8,134,699
- Issue date Mar 13, 2012
- Applied Materials, Inc.
- Ron Naftali
- G01 - MEASURING TESTING
Information Patent Grant
High resolution wafer inspection system
- Patent number 7,973,919
- Issue date Jul 5, 2011
- Applied Materials Israel, Ltd.
- Dan Grossman
- G01 - MEASURING TESTING
Information Patent Grant
Illumination system for optical inspection
- Patent number 7,924,419
- Issue date Apr 12, 2011
- Applied Materials Israel, Ltd.
- Ron Naftali
- G01 - MEASURING TESTING
Information Patent Grant
High resolution wafer inspection system
- Patent number 7,714,999
- Issue date May 11, 2010
- Applied Materials Israel, Ltd.
- Dan Grossman
- G01 - MEASURING TESTING
Information Patent Grant
Scanning microscopy
- Patent number 7,684,048
- Issue date Mar 23, 2010
- Applied Materials Israel, Ltd.
- Doron Meshulach
- G01 - MEASURING TESTING
Information Patent Grant
Simulation of aerial images
- Patent number 7,634,754
- Issue date Dec 15, 2009
- Applied Materials, Israel, Ltd.
- Haim Feldman
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Illumination system for optical inspection
- Patent number 7,630,069
- Issue date Dec 8, 2009
- Applied Materials, Inc.
- Ron Naftali
- G01 - MEASURING TESTING
Information Patent Grant
Simulation of aerial images
- Patent number 7,620,932
- Issue date Nov 17, 2009
- Applied Materials, Israel, Ltd.
- Haim Feldman
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
One-dimensional phase contrast microscopy with a traveling lens gen...
- Patent number 7,576,348
- Issue date Aug 18, 2009
- Applied Materials, Israel, Ltd.
- Haim Feldman
- G01 - MEASURING TESTING
Information Patent Grant
High throughput inspection system and a method for generating trans...
- Patent number 7,518,718
- Issue date Apr 14, 2009
- Applied Materials, Israel, Ltd.
- Emanuel Elyasaf
- G01 - MEASURING TESTING
Information Patent Grant
Printer and a method for recording a multi-level image
- Patent number 7,379,161
- Issue date May 27, 2008
- Applied Materials, Israel, Ltd.
- Gilad Almogy
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Methods and systems for optical inspection of surfaces based on las...
- Patent number 7,342,218
- Issue date Mar 11, 2008
- Applied Materials, Israel, Ltd.
- Gilad Almogy
- G01 - MEASURING TESTING
Information Patent Grant
Dark field inspection system
- Patent number 7,339,661
- Issue date Mar 4, 2008
- Doron Korngut
- G01 - MEASURING TESTING
Information Patent Grant
Simulation of aerial images
- Patent number 7,331,033
- Issue date Feb 12, 2008
- Applied Materials, Israel, Ltd.
- Haim Feldman
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Laser scanner with amplitude and phase detection
- Patent number 7,286,239
- Issue date Oct 23, 2007
- Applied Materials, Israel, Ltd.
- Haim Feldman
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PULSE STRETCHER SYSTEM AND METHOD
- Publication number 20250055241
- Publication date Feb 13, 2025
- Applied Materials Israel Ltd.
- Ron NAFTALI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL INSPECTION SYSTEMS WITH PULSED LIGHT SOURCES AND PULSE MULT...
- Publication number 20240280506
- Publication date Aug 22, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Elad EIZNER
- G01 - MEASURING TESTING
Information Patent Application
LASER PULSE CASCADE
- Publication number 20240280802
- Publication date Aug 22, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Boris GOLBERG
- G02 - OPTICS
Information Patent Application
POLARIZATION OPTICAL SYSTEM
- Publication number 20240255770
- Publication date Aug 1, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Boris GOLBERG
- G01 - MEASURING TESTING
Information Patent Application
LIGHT SOURCE SYSTEM AND METHOD
- Publication number 20230418081
- Publication date Dec 28, 2023
- APPLIED MATERIALS ISRAEL LTD.
- Haim Feldman
- G02 - OPTICS
Information Patent Application
INSPECTION OF A THREE DIMENSIONAL STRUCTURE OF A SAMPLE USING A PHA...
- Publication number 20220058784
- Publication date Feb 24, 2022
- APPLIED MATERIALS ISRAEL LTD.
- Haim Feldman
- G01 - MEASURING TESTING
Information Patent Application
MULTI-PERSPECTIVE WAFER ANALYSIS
- Publication number 20200400589
- Publication date Dec 24, 2020
- Applied Materials Israel, Ltd.
- Haim FELDMAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTI-PERSPECTIVE WAFER ANALYSIS
- Publication number 20200232934
- Publication date Jul 23, 2020
- APPLIED MATERIALS ISRAEL, LTD.
- Haim FELDMAN
- G01 - MEASURING TESTING
Information Patent Application
COMPUTERIZED SYSTEM AND METHOD FOR OBTAINING INFORMATION ABOUT A RE...
- Publication number 20200234418
- Publication date Jul 23, 2020
- Applied Materials Israel, Ltd.
- Haim FELDMAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ASYMMETRICAL MAGNIFICATION INSPECTION SYSTEM AND ILLUMINATION MODULE
- Publication number 20180209915
- Publication date Jul 26, 2018
- APPLIED MATERIALS ISRAEL LTD.
- Haim Feldman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR INSPECTING AN OBJECT
- Publication number 20170016834
- Publication date Jan 19, 2017
- APPLIED MATERIALS ISRAEL, LTD.
- Haim Feldman
- G02 - OPTICS
Information Patent Application
EVALUATION SYSTEM AND A METHOD FOR EVALUATING A SUBSTRATE
- Publication number 20160077016
- Publication date Mar 17, 2016
- APPLIED MATERIALS ISRAEL LTD.
- Yoram Uziel
- G01 - MEASURING TESTING
Information Patent Application
ON-TOOL WAVEFRONT ABERRATIONS MEASUREMENT SYSTEM AND METHOD
- Publication number 20150300913
- Publication date Oct 22, 2015
- APPLIED MATERIALS ISRAEL LTD.
- Boris Golberg
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION METHOD AND AN INSPECTION SYSTEM EXHIBITING SPECKLE REDUC...
- Publication number 20140299790
- Publication date Oct 9, 2014
- APPLIED MATERIALS ISRAEL, LTD.
- Amir Shoham
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND METHOD FOR FAST CHANGES OF FOCUS
- Publication number 20130342893
- Publication date Dec 26, 2013
- Haim Feldman
- G02 - OPTICS
Information Patent Application
INSPECTION SYSTEM AND METHOD FOR FAST CHANGES OF FOCUS
- Publication number 20120086937
- Publication date Apr 12, 2012
- Haim Feldman
- G02 - OPTICS
Information Patent Application
ILLUMINATION SYSTEM FOR OPTICAL INSPECTION
- Publication number 20110170090
- Publication date Jul 14, 2011
- Ron Naftali
- G01 - MEASURING TESTING
Information Patent Application
HIGH RESOLUTION WAFER INSPECTION SYSTEM
- Publication number 20100188658
- Publication date Jul 29, 2010
- Dan Grossman
- G01 - MEASURING TESTING
Information Patent Application
ILLUMINATION SYSTEM FOR OPTICAL INSPECTION
- Publication number 20100097680
- Publication date Apr 22, 2010
- Ron Naftali
- G01 - MEASURING TESTING
Information Patent Application
SCANNING MICROSCOPY USING INHOMOGENEOUS POLARIZATION
- Publication number 20090284835
- Publication date Nov 19, 2009
- Doron Meshulach
- G02 - OPTICS
Information Patent Application
HIGH RESOLUTION WAFER INSPECTION SYSTEM
- Publication number 20080231845
- Publication date Sep 25, 2008
- Dan Grossman
- G01 - MEASURING TESTING
Information Patent Application
SIMULATION OF AERIAL IMAGES
- Publication number 20080152212
- Publication date Jun 26, 2008
- Haim Feldman
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SIMULATION OF AERIAL IMAGES
- Publication number 20080152234
- Publication date Jun 26, 2008
- Haim Feldman
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
ONE-DIMENSIONAL PHASE CONTRAST MICROSCOPY
- Publication number 20080116362
- Publication date May 22, 2008
- APPLIED MATERIALS, ISRAEL, LTD.
- Haim Feldman
- G01 - MEASURING TESTING
Information Patent Application
Scanning Microscopy
- Publication number 20070109546
- Publication date May 17, 2007
- Doron Meshulach
- G01 - MEASURING TESTING
Information Patent Application
Illumination system for optical inspection
- Publication number 20070008519
- Publication date Jan 11, 2007
- APPLIED MATERIALS, INC.
- Ron Naftali
- G01 - MEASURING TESTING
Information Patent Application
High Throughput Inspection System and a Method for Generating Trans...
- Publication number 20060221331
- Publication date Oct 5, 2006
- Emanuel Elyasaf
- G01 - MEASURING TESTING
Information Patent Application
Printer and a method for recording a multi-level image
- Publication number 20060197931
- Publication date Sep 7, 2006
- Gilad Almogy
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Simulation of aerial images
- Publication number 20060048090
- Publication date Mar 2, 2006
- Applied Materials Israel Ltd.
- Haim Feldman
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
High throughput inspection system and method for generating transmi...
- Publication number 20050270521
- Publication date Dec 8, 2005
- Emanuel Elyasaf
- G01 - MEASURING TESTING

Haim Feldman

Person

Patents Grantslast 30 patents

Multi-perspective wafer analysis

System and method for defect detection using multi-spot scanning

Inspection of a three dimensional structure of a sample using a pha...

Computerized system and method for obtaining information about a re...

Asymmetrical magnification inspection system and illumination module

System and method for defect detection using multi-spot scanning

Near-field sensor height control

Evaluation system and a method for evaluating a substrate

System and method for defect detection using multi-spot scanning

Systems and methods for inspecting an object

On-tool wavefront aberrations measurement system and method

Inspection method and an inspection system exhibiting speckle reduc...

Inspection system and method for fast changes of focus

Inspection system and method for fast changes of focus

Scanning microscopy using inhomogeneous polarization

Illumination system for optical inspection

High resolution wafer inspection system

Illumination system for optical inspection

High resolution wafer inspection system

Scanning microscopy

Simulation of aerial images

Illumination system for optical inspection

Simulation of aerial images

One-dimensional phase contrast microscopy with a traveling lens gen...

High throughput inspection system and a method for generating trans...

Printer and a method for recording a multi-level image

Methods and systems for optical inspection of surfaces based on las...

Dark field inspection system

Simulation of aerial images

Laser scanner with amplitude and phase detection

Patents Applicationslast 30 patents

PULSE STRETCHER SYSTEM AND METHOD

OPTICAL INSPECTION SYSTEMS WITH PULSED LIGHT SOURCES AND PULSE MULT...

LASER PULSE CASCADE

POLARIZATION OPTICAL SYSTEM

LIGHT SOURCE SYSTEM AND METHOD

INSPECTION OF A THREE DIMENSIONAL STRUCTURE OF A SAMPLE USING A PHA...

MULTI-PERSPECTIVE WAFER ANALYSIS

MULTI-PERSPECTIVE WAFER ANALYSIS

COMPUTERIZED SYSTEM AND METHOD FOR OBTAINING INFORMATION ABOUT A RE...

ASYMMETRICAL MAGNIFICATION INSPECTION SYSTEM AND ILLUMINATION MODULE

SYSTEMS AND METHODS FOR INSPECTING AN OBJECT

EVALUATION SYSTEM AND A METHOD FOR EVALUATING A SUBSTRATE

ON-TOOL WAVEFRONT ABERRATIONS MEASUREMENT SYSTEM AND METHOD

INSPECTION METHOD AND AN INSPECTION SYSTEM EXHIBITING SPECKLE REDUC...

INSPECTION SYSTEM AND METHOD FOR FAST CHANGES OF FOCUS

INSPECTION SYSTEM AND METHOD FOR FAST CHANGES OF FOCUS

ILLUMINATION SYSTEM FOR OPTICAL INSPECTION

HIGH RESOLUTION WAFER INSPECTION SYSTEM

ILLUMINATION SYSTEM FOR OPTICAL INSPECTION

SCANNING MICROSCOPY USING INHOMOGENEOUS POLARIZATION

HIGH RESOLUTION WAFER INSPECTION SYSTEM

SIMULATION OF AERIAL IMAGES

SIMULATION OF AERIAL IMAGES

ONE-DIMENSIONAL PHASE CONTRAST MICROSCOPY

Scanning Microscopy

Illumination system for optical inspection

High Throughput Inspection System and a Method for Generating Trans...

Printer and a method for recording a multi-level image

Simulation of aerial images

High throughput inspection system and method for generating transmi...