Haiming Wang

Person

Fremont, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Detecting dark objects in stray light halos
- Patent number 12,072,466
- Issue date Aug 27, 2024
- Zoox, Inc.
- Ryan McMichael
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Small spot size spectroscopic ellipsometer
- Patent number 9,952,140
- Issue date Apr 24, 2018
- KLA-Tencor Corporation
- Haiming Wang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Selectably configurable multiple mode spectroscopic ellipsometry
- Patent number 9,404,872
- Issue date Aug 2, 2016
- KLA-Tencor Corporation
- Haiming Wang
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of critical dimension
- Patent number 8,456,639
- Issue date Jun 4, 2013
- KLA-Tencor Corporation
- Shankar Krishnan
- G01 - MEASURING TESTING
Information Patent Grant
Reconfigurable spectroscopic ellipsometer
- Patent number 8,446,584
- Issue date May 21, 2013
- KLA-Tencor Corporation
- Shankar Krishnan
- G01 - MEASURING TESTING
Information Patent Grant
Azimuth angle measurement
- Patent number 8,040,511
- Issue date Oct 18, 2011
- KLA-Tencor Corporation
- Shankar Krishnan
- G01 - MEASURING TESTING
Information Patent Grant
Multiple angle of incidence spectroscopic scatterometer system
- Patent number 7,483,133
- Issue date Jan 27, 2009
- KLA-Tencor Technologies Corporation
- Noah Bareket
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for measuring one or more characteristics of pa...
- Patent number 7,463,369
- Issue date Dec 9, 2008
- KLA-Tencor Technologies Corp.
- Dan Wack
- G01 - MEASURING TESTING
Information Patent Grant
Self-calibrating beam profile ellipsometer
- Patent number 7,054,006
- Issue date May 30, 2006
- Therma-Wave, Inc.
- Haiming Wang
- G01 - MEASURING TESTING
Information Patent Grant
System for analyzing surface characteristics with self-calibrating...
- Patent number 6,804,003
- Issue date Oct 12, 2004
- KLA-Tencor Corporation
- Haiming Wang
- G01 - MEASURING TESTING
Information Patent Grant
System for analyzing surface characteristics with self-calibrating...
- Patent number 6,734,968
- Issue date May 11, 2004
- Haiming Wang
- G01 - MEASURING TESTING
Information Patent Grant
System for measuring polarimetric spectrum and other properties of...
- Patent number 6,611,330
- Issue date Aug 26, 2003
- KLA-Tencor Corporation
- Shing Lee
- G01 - MEASURING TESTING
Information Patent Grant
Detection of film thickness through induced acoustic pulse-echos
- Patent number 6,552,803
- Issue date Apr 22, 2003
- KLA-Tencor Corporation
- Haiming Wang
- G01 - MEASURING TESTING
Information Patent Grant
System for measuring polarimetric spectrum and other properties of...
- Patent number 6,184,984
- Issue date Feb 6, 2001
- KLA-Tencor Corporation
- Shing Lee
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact system for measuring film thickness
- Patent number 6,108,087
- Issue date Aug 22, 2000
- KLA-Tencor Corporation
- Mehrdad Nikoonahad
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
LIDAR SYSTEMS WITH IMPROVED TUNABLE OPTICAL DELAY LINES
- Publication number 20220206355
- Publication date Jun 30, 2022
- Semiconductor Components Industries, LLC
- Haiming WANG
- G01 - MEASURING TESTING
Information Patent Application
Small Spot Size Spectroscopic Ellipsometer
- Publication number 20130321810
- Publication date Dec 5, 2013
- Haiming Wang
- G01 - MEASURING TESTING
Information Patent Application
Measurement of Critical Dimension
- Publication number 20130003068
- Publication date Jan 3, 2013
- KLA-Tencor Corporation
- Shankar Krishnan
- G01 - MEASURING TESTING
Information Patent Application
Reconfigurable Spectroscopic Ellipsometer
- Publication number 20120287433
- Publication date Nov 15, 2012
- KLA-Tencor Corporation
- Shankar Krishnan
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Measuring One or More Characteristics of Pa...
- Publication number 20070229852
- Publication date Oct 4, 2007
- KLA-TENCOR TECHNOLOGIES CORP.
- Dan Wack
- G01 - MEASURING TESTING
Information Patent Application
Multiple angle of incidence spectroscopic scatterometer system
- Publication number 20060126079
- Publication date Jun 15, 2006
- KLA-Tencor Technologies Coporation
- Noah Bareket
- G01 - MEASURING TESTING
Information Patent Application
Self-calibrating beam profile ellipsometer
- Publication number 20040233436
- Publication date Nov 25, 2004
- Haiming Wang
- G01 - MEASURING TESTING
Information Patent Application
System for measuring polarimetric spectrum and other properties of...
- Publication number 20020008874
- Publication date Jan 24, 2002
- Shing Lee
- G01 - MEASURING TESTING

Haiming Wang

Person

Patents Grantslast 30 patents

Detecting dark objects in stray light halos

Small spot size spectroscopic ellipsometer

Selectably configurable multiple mode spectroscopic ellipsometry

Measurement of critical dimension

Reconfigurable spectroscopic ellipsometer

Azimuth angle measurement

Multiple angle of incidence spectroscopic scatterometer system

Systems and methods for measuring one or more characteristics of pa...

Self-calibrating beam profile ellipsometer

System for analyzing surface characteristics with self-calibrating...

System for analyzing surface characteristics with self-calibrating...

System for measuring polarimetric spectrum and other properties of...

Detection of film thickness through induced acoustic pulse-echos

System for measuring polarimetric spectrum and other properties of...

Non-contact system for measuring film thickness

Patents Applicationslast 30 patents

LIDAR SYSTEMS WITH IMPROVED TUNABLE OPTICAL DELAY LINES

Small Spot Size Spectroscopic Ellipsometer

Measurement of Critical Dimension

Reconfigurable Spectroscopic Ellipsometer

Systems and Methods for Measuring One or More Characteristics of Pa...

Multiple angle of incidence spectroscopic scatterometer system

Self-calibrating beam profile ellipsometer

System for measuring polarimetric spectrum and other properties of...