Hairong LEI

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San Jose, CA, US

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Patents Applicationslast 30 patents

Information Patent Application
METHODS AND SYSTEMS FOR IMPROVING WAFER DEFECT CLASSIFICATION NUISA...
- Publication number 20250166161
- Publication date May 22, 2025
- ASML NETHERLANDS B.V.
- Hairong LEI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE ENHANCEMENT IN CHARGED PARTICLE INSPECTION
- Publication number 20250095116
- Publication date Mar 20, 2025
- ASML NETHERLANDS B.V.
- Hairong LEI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMPROVED CHARGED PARTICLE IMAGE INSPECTION
- Publication number 20240212131
- Publication date Jun 27, 2024
- ASML NETHERLANDS B.V.
- Hairong LEI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHODS TO GENERATE DEBLURRING MODEL AND DEBLUR IMAGE
- Publication number 20240005457
- Publication date Jan 4, 2024
- ASML NETHERLANDS B.V.
- Hairong LEI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHODS FOR GENERATING DENOISING MODEL
- Publication number 20230230208
- Publication date Jul 20, 2023
- ASML NETHERLANDS B.V.
- Hairong LEI
- G06 - COMPUTING CALCULATING COUNTING