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Haixing Zou
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Sunnyvale, CA, US
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last 30 patents
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Patent Grant
Measurement systems configured to perform measurements of a specime...
Patent number
7,869,040
Issue date
Jan 11, 2011
KLA-Tencor Technologies Corp.
Hidong Kwak
G01 - MEASURING TESTING
Information
Patent Grant
Measurement systems configured to perform measurements of a specime...
Patent number
7,408,641
Issue date
Aug 5, 2008
KLA-Tencor Technologies Corp.
Hidong Kwak
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for preparing a sample for thin film analysis
Patent number
7,190,441
Issue date
Mar 13, 2007
KLA-Tencor Technologies Corp.
James T. McWhirter
G01 - MEASURING TESTING