Hajime Bungo

Person

  • Muko-shi, JP

Patents Grantslast 30 patents

  • Information Patent Grant

    Analytical device

    • Patent number 10,073,505
    • Issue date Sep 11, 2018
    • SHIMADZU CORPORATION
    • Hajime Bungo
    • G05 - CONTROLLING REGULATING
  • Information Patent Grant

    Spectrophotometer

    • Patent number 9,784,616
    • Issue date Oct 10, 2017
    • Shimadzu Corporation
    • Hajime Bungo
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Deuterium lamp power supply circuit

    • Patent number 9,198,267
    • Issue date Nov 24, 2015
    • Shimadzu Corporation
    • Yugo Ishihara
    • H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
  • Information Patent Grant

    Light source apparatus

    • Patent number 8,729,831
    • Issue date May 20, 2014
    • Shimadzu Corporation
    • Hajime Bungo
    • H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
  • Information Patent Grant

    Method for adjusting the detector of a chromatograph

    • Patent number 8,281,639
    • Issue date Oct 9, 2012
    • Shimadzu Corporation
    • Hajime Bungo
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Spectrophotometer

    • Patent number 7,940,388
    • Issue date May 10, 2011
    • Shimadzu Corporation
    • Hajime Bungo
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Spectrophotometer

    • Patent number 6,795,180
    • Issue date Sep 21, 2004
    • Shimadzu Corporation
    • Hajime Bungo
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Detection device for apparatus for analysis

    • Patent number 6,408,684
    • Issue date Jun 25, 2002
    • Shimadzu Corporation
    • Hajime Bungo
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Multi-channel spectro-photometers

    • Patent number 5,920,389
    • Issue date Jul 6, 1999
    • Shimadzu Corporation
    • Hajime Bungo
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    ANALYTICAL DEVICE

    • Publication number 20160282380
    • Publication date Sep 29, 2016
    • SHIMADZU CORPORATION
    • Hajime BUNGO
    • G01 - MEASURING TESTING
  • Information Patent Application

    ANALYTICAL DEVICE

    • Publication number 20160018863
    • Publication date Jan 21, 2016
    • Shimadzu Corporation
    • Hajime BUNGO
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    SPECTROPHOTOMETER

    • Publication number 20150219493
    • Publication date Aug 6, 2015
    • Shimadzu Corporation
    • Hajime Bungo
    • G01 - MEASURING TESTING
  • Information Patent Application

    DEUTERIUM LAMP POWER SUPPLY CIRCUIT

    • Publication number 20140117870
    • Publication date May 1, 2014
    • Shimadzu Corporation
    • Yugo ISHIHARA
    • H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
  • Information Patent Application

    LIGHT SOURCE APPARATUS

    • Publication number 20130049639
    • Publication date Feb 28, 2013
    • Shimadzu Corporation
    • Hajime Bungo
    • H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
  • Information Patent Application

    DETECTOR FOR CHROMATOGRAPH AND METHOD FOR ADJUSTING THE SAME

    • Publication number 20100116016
    • Publication date May 13, 2010
    • Shimadzu Corporation
    • Hajime Bungo
    • G01 - MEASURING TESTING
  • Information Patent Application

    SPECTROPHOTOMETER

    • Publication number 20090153855
    • Publication date Jun 18, 2009
    • Shimadzu Corporation
    • Hajime Bungo
    • G01 - MEASURING TESTING
  • Information Patent Application

    Spectrophotometer

    • Publication number 20030142305
    • Publication date Jul 31, 2003
    • SHIMADZU CORPORATION
    • Hajime Bungo
    • G01 - MEASURING TESTING
  • Information Patent Application

    Spectrophotometer

    • Publication number 20020080352
    • Publication date Jun 27, 2002
    • SHIMADZU COPORATION
    • Hajime Bungo
    • G01 - MEASURING TESTING