Hajime Ichikawa

Person

Yokohama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Interferometer that measures aspherical surfaces
- Patent number 6,456,382
- Issue date Sep 24, 2002
- Nikon Corporation
- Hiroshi Ichihara
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Interferometric apparatus and methods for measuring surface topogra...
- Patent number 6,344,898
- Issue date Feb 5, 2002
- Nikon Corporation
- Takashi Gemma
- G01 - MEASURING TESTING
Information Patent Grant
Magnification calibration apparatus and shape measuring system
- Patent number 6,100,980
- Issue date Aug 8, 2000
- Nikon Corporation
- Hajime Ichikawa
- G01 - MEASURING TESTING
Information Patent Grant
Non-spherical surface shape measuring device
- Patent number 6,032,377
- Issue date Mar 7, 2000
- Nikon Corporation
- Hajime Ichikawa
- G01 - MEASURING TESTING
Information Patent Grant
Shape measurement method and high-precision lens manufacturing process
- Patent number 5,986,760
- Issue date Nov 16, 1999
- Nikon Corporation
- Shigeru Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for wavefront absolute calibration and method...
- Patent number 5,982,490
- Issue date Nov 9, 1999
- Nikon Corporation
- Hajime Ichikawa
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring temperature of semiconductor substrate and app...
- Patent number 4,890,245
- Issue date Dec 26, 1989
- Nikon Corporation
- Masahiko Yomoto
- G01 - MEASURING TESTING
Information Patent Grant
Light radiation apparatus
- Patent number 4,859,832
- Issue date Aug 22, 1989
- Nikon Corporation
- Makoto Uehara
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Interferometer system and method of manufactruing projection optica...
- Publication number 20020191195
- Publication date Dec 19, 2002
- NIKON CORPORATION
- Hiroshi Ichihara
- G01 - MEASURING TESTING
Information Patent Application
Interferometer system and method of manufacturing projection optica...
- Publication number 20010028462
- Publication date Oct 11, 2001
- NIKON CORPORATION
- Hiroshi Ichihara
- G01 - MEASURING TESTING

Hajime Ichikawa

Person

Patents Grantslast 30 patents

Interferometer that measures aspherical surfaces

Interferometric apparatus and methods for measuring surface topogra...

Magnification calibration apparatus and shape measuring system

Non-spherical surface shape measuring device

Shape measurement method and high-precision lens manufacturing process

Apparatus and method for wavefront absolute calibration and method...

Method for measuring temperature of semiconductor substrate and app...

Light radiation apparatus

Patents Applicationslast 30 patents

Interferometer system and method of manufactruing projection optica...

Interferometer system and method of manufacturing projection optica...