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Hajime KATOU
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Chiyoda, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Chemical analysis apparatus and chemical analysis method
Patent number
9,291,634
Issue date
Mar 22, 2016
Hitachi High-Technologies Corporation
Hajime Katou
G01 - MEASURING TESTING
Information
Patent Grant
Chemical analysis apparatus and chemical analysis method
Patent number
8,658,102
Issue date
Feb 25, 2014
Hitachi High-Technologies Corporation
Hajime Katou
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analyzer
Patent number
7,955,557
Issue date
Jun 7, 2011
Hitachi, Ltd.
Shigenori Watari
G01 - MEASURING TESTING
Information
Patent Grant
Chemical analysis apparatus and chemical analysis method
Patent number
7,722,815
Issue date
May 25, 2010
Hitachi High-Technologies Corporation
Hajime Katou
G01 - MEASURING TESTING
Information
Patent Grant
Chemical analysis apparatus and chemical analysis method
Patent number
7,670,558
Issue date
Mar 2, 2010
Hitachi High-Technologies Corporation
Hajime Katou
G01 - MEASURING TESTING
Information
Patent Grant
Distributed testing apparatus and host testing apparatus
Patent number
7,516,351
Issue date
Apr 7, 2009
Hitachi, Ltd.
Hisao Inami
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Chemical analyzer and chemical analyzing system
Patent number
6,852,282
Issue date
Feb 8, 2005
Hitachi, Ltd.
Ryo Miyake
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analyzer
Patent number
6,737,021
Issue date
May 18, 2004
Hitachi, Ltd.
Shigenori Watari
G01 - MEASURING TESTING
Information
Patent Grant
Chemical analyzer and chemical analyzing system
Patent number
6,383,452
Issue date
May 7, 2002
Hitachi, Ltd.
Ryo Miyake
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
CHEMICAL ANALYSIS APPARATUS AND CHEMICAL ANALYSIS METHOD
Publication number
20140147348
Publication date
May 29, 2014
Hitachi High-Technologies Corporation
Hajime KATOU
G01 - MEASURING TESTING
Information
Patent Application
CHEMICAL ANALYSIS APPARATUS AND CHEMICAL ANALYSIS METHOD
Publication number
20100233027
Publication date
Sep 16, 2010
Hajime Katou
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Chemical analysis apparatus and chemical analysis method
Publication number
20070009387
Publication date
Jan 11, 2007
Hajime Katou
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Distributed testing apparatus and host testing apparatus
Publication number
20050060599
Publication date
Mar 17, 2005
Hisao Inami
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Automatic analyzer
Publication number
20040076545
Publication date
Apr 22, 2004
Hitachi, Ltd.
Shigenori Watari
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Chemical analysis apparatus and chemical analysis method
Publication number
20030166260
Publication date
Sep 4, 2003
Hajime Katou
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Chemical analyzer and chemical analyzing system
Publication number
20020110488
Publication date
Aug 15, 2002
Ryo Miyake
G01 - MEASURING TESTING
Information
Patent Application
Automatic analyzer
Publication number
20010019702
Publication date
Sep 6, 2001
Shigenori Watari
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL