Hajime Sasaki

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Crystal defect observation method for compound semiconductor
- Patent number 12,038,396
- Issue date Jul 16, 2024
- Mitsubishi Electric Corporation
- Hajime Sasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test method of a semiconductor device and manufacturing method of a...
- Patent number 11,885,716
- Issue date Jan 30, 2024
- Mitsubishi Electric Corporation
- Hajime Sasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of producing test-sample for transmission electron microscope
- Patent number 11,747,243
- Issue date Sep 5, 2023
- Mitsubishi Electric Corporation
- Hajime Sasaki
- G01 - MEASURING TESTING
Information Patent Grant
Test method of a semiconductor device and manufacturing method of a...
- Patent number 11,499,886
- Issue date Nov 15, 2022
- Mitsubishi Electric Corporation
- Hajime Sasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Compound semiconductor device including MOTT insulator for preventi...
- Patent number 11,283,021
- Issue date Mar 22, 2022
- Mitsubishi Electric Corporation
- Hajime Sasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing compound semiconductor device
- Patent number 10,957,770
- Issue date Mar 23, 2021
- Mitsubishi Electric Corporation
- Hajime Sasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Compound semiconductor device
- Patent number 10,644,119
- Issue date May 5, 2020
- Mitsubishi Electric Corporation
- Hajime Sasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing nitride semiconductor device
- Patent number 9,691,875
- Issue date Jun 27, 2017
- Mitsubishi Electric Corporation
- Hajime Sasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing nitride semiconductor device, and burn-in a...
- Patent number 9,129,921
- Issue date Sep 8, 2015
- Mitsubishi Electric Corporation
- Hajime Sasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and electronic device
- Patent number 9,083,353
- Issue date Jul 14, 2015
- Renesas Electronics Corporation
- Hajime Sasaki
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Field-effect transistor
- Patent number 9,054,168
- Issue date Jun 9, 2015
- Mitsubishi Electric Corporation
- Yoichi Kinoshita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing transistor
- Patent number 8,987,076
- Issue date Mar 24, 2015
- Mitsubishi Electric Corporation
- Hajime Sasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Data processor with memory controller having burst access operation
- Patent number 7,953,941
- Issue date May 31, 2011
- Renesas Electronics Corporation
- Masayoshi Horishima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Data processor
- Patent number 7,725,665
- Issue date May 25, 2010
- Renesas Technology Corp.
- Masayoshi Horishima
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
RADIATION RESISTANT SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURI...
- Publication number 20240387607
- Publication date Nov 21, 2024
- Mitsubishi Electric Corporation
- Hajime SASAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CRYSTAL DEFECT OBSERVATION METHOD FOR COMPOUND SEMICONDUCTOR
- Publication number 20220268715
- Publication date Aug 25, 2022
- Mitsubishi Electric Corporation
- Hajime SASAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF PRODUCING TEST-SAMPLE FOR TRANSMISSION ELECTRON MICROSCOPE
- Publication number 20210102872
- Publication date Apr 8, 2021
- Mitsubishi Electric Corporation
- Hajime SASAKI
- G01 - MEASURING TESTING
Information Patent Application
TEST METHOD OF A SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF A...
- Publication number 20200319055
- Publication date Oct 8, 2020
- Mitsubishi Electric Corporation
- Hajime SASAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING COMPOUND SEMICONDUCTOR DEVICE
- Publication number 20200295144
- Publication date Sep 17, 2020
- Mitsubishi Electric Corporation
- Hajime SASAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPOUND SEMICONDUCTOR DEVICE
- Publication number 20200220079
- Publication date Jul 9, 2020
- Mitsubishi Electric Corporation
- Hajime SASAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST METHOD OF A SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF A...
- Publication number 20200124492
- Publication date Apr 23, 2020
- Mitsubishi Electric Corporation
- Hajime SASAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPOUND SEMICONDUCTOR DEVICE
- Publication number 20190273140
- Publication date Sep 5, 2019
- Mitsubishi Electric Corporation
- Hajime SASAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANUFACTURING NITRIDE SEMICONDUCTOR DEVICE
- Publication number 20160141385
- Publication date May 19, 2016
- Mitsubishi Electric Corporation
- Hajime SASAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND ELECTRONIC DEVICE
- Publication number 20150311904
- Publication date Oct 29, 2015
- RENESAS ELECTRONICS CORPORATION
- Hajime Sasaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF MANUFACTURING NITRIDE SEMICONDUCTOR DEVICE, AND BURN-IN A...
- Publication number 20150064811
- Publication date Mar 5, 2015
- Mitsubishi Electric Corporation
- Hajime SASAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FIELD-EFFECT TRANSISTOR
- Publication number 20140319582
- Publication date Oct 30, 2014
- Mitsubishi Electric Corporation
- Yoichi Kinoshita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANUFACTURING TRANSISTOR AND METHOD OF MANUFACTURING AMPL...
- Publication number 20140295635
- Publication date Oct 2, 2014
- Mitsubishi Electric Corporation
- Hajime SASAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND ELECTRONIC DEVICE
- Publication number 20140043075
- Publication date Feb 13, 2014
- Renesas Mobile Corporation
- Hajime Sasaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WIDE-BANDGAP SEMICONDUCTOR DEVICE
- Publication number 20130049007
- Publication date Feb 28, 2013
- Mitsubishi Electric Corporation
- Hajime SASAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DATA PROCESSOR
- Publication number 20100174857
- Publication date Jul 8, 2010
- RENESAS TECHNOLOGY CORP.
- Masayoshi Horishima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Data processor
- Publication number 20090228633
- Publication date Sep 10, 2009
- Masayoshi Horishima
- G06 - COMPUTING CALCULATING COUNTING

Hajime Sasaki

Person

Patents Grantslast 30 patents

Crystal defect observation method for compound semiconductor

Test method of a semiconductor device and manufacturing method of a...

Method of producing test-sample for transmission electron microscope

Test method of a semiconductor device and manufacturing method of a...

Compound semiconductor device including MOTT insulator for preventi...

Method for manufacturing compound semiconductor device

Compound semiconductor device

Method of manufacturing nitride semiconductor device

Method of manufacturing nitride semiconductor device, and burn-in a...

Semiconductor device and electronic device

Field-effect transistor

Method of manufacturing transistor

Data processor with memory controller having burst access operation

Data processor

Patents Applicationslast 30 patents

RADIATION RESISTANT SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURI...

CRYSTAL DEFECT OBSERVATION METHOD FOR COMPOUND SEMICONDUCTOR

METHOD OF PRODUCING TEST-SAMPLE FOR TRANSMISSION ELECTRON MICROSCOPE

TEST METHOD OF A SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF A...

METHOD FOR MANUFACTURING COMPOUND SEMICONDUCTOR DEVICE

COMPOUND SEMICONDUCTOR DEVICE

TEST METHOD OF A SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF A...

COMPOUND SEMICONDUCTOR DEVICE

METHOD OF MANUFACTURING NITRIDE SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE AND ELECTRONIC DEVICE

METHOD OF MANUFACTURING NITRIDE SEMICONDUCTOR DEVICE, AND BURN-IN A...

FIELD-EFFECT TRANSISTOR

METHOD OF MANUFACTURING TRANSISTOR AND METHOD OF MANUFACTURING AMPL...

SEMICONDUCTOR DEVICE AND ELECTRONIC DEVICE

WIDE-BANDGAP SEMICONDUCTOR DEVICE

DATA PROCESSOR

Data processor