Hajime SUGIMURA

Person

Saitama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Analysis apparatus, analysis method, and recording medium having re...
- Patent number 12,146,896
- Issue date Nov 19, 2024
- Advantest Corporation
- Yuji Sakai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Maintenance apparatus, maintenance method, and recording medium hav...
- Patent number 12,014,335
- Issue date Jun 18, 2024
- Advantest Corporation
- Hajime Sugimura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test apparatus and test module
- Patent number 9,342,425
- Issue date May 17, 2016
- Advantest Corporation
- Takeshi Yaguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test apparatus and test module
- Patent number 9,223,670
- Issue date Dec 29, 2015
- Advantest Corporation
- Hajime Sugimura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test apparatus and test module
- Patent number 9,201,750
- Issue date Dec 1, 2015
- Advantest Corporation
- Hajime Sugimura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test apparatus and test method
- Patent number 8,149,721
- Issue date Apr 3, 2012
- Advantest Corporation
- Shinichi Ishikawa
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR TEST RESULT ANALYSIS DEVICE, SEMICONDUCTOR TEST RESUL...
- Publication number 20240393389
- Publication date Nov 28, 2024
- Advantest Corporation
- Kosuke IKEDA
- G01 - MEASURING TESTING
Information Patent Application
DETERMINATION APPARATUS, TEST SYSTEM, DETERMINATION METHOD, AND COM...
- Publication number 20220300390
- Publication date Sep 22, 2022
- Advantest Corporation
- Kosuke IKEDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MAINTENANCE APPARATUS, MAINTENANCE METHOD, AND RECORDING MEDIUM HAV...
- Publication number 20220188776
- Publication date Jun 16, 2022
- Advantest Corporation
- Hajime SUGIMURA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ANALYSIS APPARATUS, ANALYSIS METHOD, AND RECORDING MEDIUM HAVING RE...
- Publication number 20210199693
- Publication date Jul 1, 2021
- Advantest Corporation
- Yuji SAKAI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ANALYSIS APPARATUS, ANALYSIS METHOD, AND RECORDING MEDIUM HAVING RE...
- Publication number 20210199694
- Publication date Jul 1, 2021
- Advantest Corporation
- Yuji SAKAI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ANALYSIS APPARATUS, ANALYSIS METHOD, AND RECORDING MEDIUM HAVING RE...
- Publication number 20210199713
- Publication date Jul 1, 2021
- Advantest Corporation
- Yuji SAKAI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST APPARATUS AND TEST MODULE
- Publication number 20130231888
- Publication date Sep 5, 2013
- Advantest Corporation
- Hajime SUGIMURA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST APPARATUS AND TEST MODULE
- Publication number 20130231887
- Publication date Sep 5, 2013
- Advantest Corporation
- Hajime SUGIMURA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST APPARATUS AND TEST MODULE
- Publication number 20130231886
- Publication date Sep 5, 2013
- Advantest Corporation
- Takeshi YAGUCHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST APPARATUS AND TEST MODULE
- Publication number 20130231885
- Publication date Sep 5, 2013
- Advantest Corporation
- Hajime SUGIMURA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM, METHOD, AND PROGRAM PRODUCT FOR SIMULATING TEST EQUIPMENT
- Publication number 20090119542
- Publication date May 7, 2009
- Advantest Corporation
- Teruhiko Nagashima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM, METHOD, AND PROGRAM PRODUCT FOR SIMULATING TEST EQUIPMENT
- Publication number 20090119084
- Publication date May 7, 2009
- Advantest Corporation
- Teruhiko Nagashima
- G01 - MEASURING TESTING

Hajime SUGIMURA

Person

Patents Grantslast 30 patents

Analysis apparatus, analysis method, and recording medium having re...

Maintenance apparatus, maintenance method, and recording medium hav...

Test apparatus and test module

Test apparatus and test module

Test apparatus and test module

Test apparatus and test method

Patents Applicationslast 30 patents

SEMICONDUCTOR TEST RESULT ANALYSIS DEVICE, SEMICONDUCTOR TEST RESUL...

DETERMINATION APPARATUS, TEST SYSTEM, DETERMINATION METHOD, AND COM...

MAINTENANCE APPARATUS, MAINTENANCE METHOD, AND RECORDING MEDIUM HAV...

ANALYSIS APPARATUS, ANALYSIS METHOD, AND RECORDING MEDIUM HAVING RE...

ANALYSIS APPARATUS, ANALYSIS METHOD, AND RECORDING MEDIUM HAVING RE...

ANALYSIS APPARATUS, ANALYSIS METHOD, AND RECORDING MEDIUM HAVING RE...

TEST APPARATUS AND TEST MODULE

TEST APPARATUS AND TEST MODULE

TEST APPARATUS AND TEST MODULE

TEST APPARATUS AND TEST MODULE

SYSTEM, METHOD, AND PROGRAM PRODUCT FOR SIMULATING TEST EQUIPMENT

SYSTEM, METHOD, AND PROGRAM PRODUCT FOR SIMULATING TEST EQUIPMENT