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Hajime Yamazaki

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  • Yokohama, JP
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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    MEMORY SYSTEM
    • Publication number 20240069747
    • Publication date Feb 29, 2024
    • KIOXIA Corporation
    • Konosuke WATANABE
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    AUTOMATIC ANALYZER AND ASSEMBLY SUPPORT SYSTEM THEREOF
    • Publication number 20230160917
    • Publication date May 25, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Shunsuke MIYAMOTO
    • G01 - MEASURING TESTING
  • Information Patent Application

    Deaerator and Electrolyte Measurement System
    • Publication number 20220268725
    • Publication date Aug 25, 2022
    • Hitachi High-Tech Corporation
    • Hiroshi SUZUKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20220074959
    • Publication date Mar 10, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Akihisa MAKINO
    • G01 - MEASURING TESTING
  • Information Patent Application

    MEMORY SYSTEM AND METHOD
    • Publication number 20210397512
    • Publication date Dec 23, 2021
    • KIOXIA Corporation
    • Yukie KUMAGAI
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    STORAGE CONTROLLER, STORAGE DEVICE, AND PROGRAM
    • Publication number 20210089227
    • Publication date Mar 25, 2021
    • KIOXIA Corporation
    • Hajime YAMAZAKI
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    MEMORY SYSTEM
    • Publication number 20200409610
    • Publication date Dec 31, 2020
    • Toshiba Memory Corporation
    • Takahiro MIOMO
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    MEMORY APPARATUS AND CONTROL METHOD FOR MEMORY APPARATUS
    • Publication number 20200301613
    • Publication date Sep 24, 2020
    • Toshiba Memory Corporation
    • Hajime YAMAZAKI
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20200124632
    • Publication date Apr 23, 2020
    • Hitachi High-Technologies Corporation
    • Kenichi HIRAMI
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    PRE-FETCHING IN A MEMORY SYSTEM CONFIGURED WITH SYNTHESIZED LOGICAL...
    • Publication number 20200110706
    • Publication date Apr 9, 2020
    • KIOXIA Corporation
    • Hirokazu TAKEUCHI
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20190346470
    • Publication date Nov 14, 2019
    • Hitachi High-Technologies Corporation
    • Akihisa Makino
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automated Analyzer and Control Method for Same
    • Publication number 20180275155
    • Publication date Sep 27, 2018
    • Hitachi High-Technologies Corporation
    • Yuya MATSUOKA
    • G01 - MEASURING TESTING
  • Information Patent Application

    PRE-FETCHING IN A MEMORY SYSTEM CONFIGURED WITH SYNTHESIZED LOGICAL...
    • Publication number 20180276129
    • Publication date Sep 27, 2018
    • Toshiba Memory Corporation
    • Hirokazu TAKEUCHI
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    MEMORY SYSTEM, MEMORY CONTROL DEVICE, AND METHOD OF CONTROLLING MEM...
    • Publication number 20180267715
    • Publication date Sep 20, 2018
    • Toshiba Memory Corporation
    • Hiroki Matsudaira
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    MEMORY SYSTEM
    • Publication number 20180267744
    • Publication date Sep 20, 2018
    • Toshiba Memory Corporation
    • Takahiro MIOMO
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    MEMORY SYSTEM
    • Publication number 20180081574
    • Publication date Mar 22, 2018
    • Toshiba Memory Corporation
    • Akihiro NAGATANI
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20170269113
    • Publication date Sep 21, 2017
    • Hitachi High-Technologies Corporation
    • Akihisa Makino
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD
    • Publication number 20160077119
    • Publication date Mar 17, 2016
    • Hitachi High-Technologies Corporation
    • Sakuichiro ADACHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    ANALYZER AND AUTOMATIC ANALYZER
    • Publication number 20160025758
    • Publication date Jan 28, 2016
    • Hitachi High-Technologies Corporation
    • Takeshi YOGI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE, AND AUTOMATIC ANALYSIS METHOD
    • Publication number 20150219556
    • Publication date Aug 6, 2015
    • Hitachi High-Technologies Corporation
    • Sakuichiro Adachi
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20150104351
    • Publication date Apr 16, 2015
    • Hitachi High-Technologies Corporation
    • Akihisa Makino
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20140241945
    • Publication date Aug 28, 2014
    • Hitachi High-Technologies Corporation
    • Mitsuru Oonuma
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYZER AND ANALYZING METHOD
    • Publication number 20140220705
    • Publication date Aug 7, 2014
    • Hitachi High-Technologies Corporation
    • Takeshi Yogi
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20140140890
    • Publication date May 22, 2014
    • Hitachi High-Technologies Corporation
    • Sakuichiro Adachi
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20130302212
    • Publication date Nov 14, 2013
    • Hitachi High-Technologies Corporation
    • Akihito Wakui
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZING APPARATUS
    • Publication number 20130243657
    • Publication date Sep 19, 2013
    • Keiko Yoshikawa
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20120315190
    • Publication date Dec 13, 2012
    • Sakuichiro Adachi
    • G01 - MEASURING TESTING
  • Information Patent Application

    MEMORY SYSTEM AND METHOD OF CONTROLLING MEMORY SYSTEM
    • Publication number 20110302361
    • Publication date Dec 8, 2011
    • KABUSHIKI KAISHA TOSHIBA
    • Hajime YAMAZAKI
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    MEMORY SYSTEM
    • Publication number 20110231610
    • Publication date Sep 22, 2011
    • Kabushiki Kaisha Toshiba
    • Hirokuni Yano
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    MEMORY SYSTEM AND METHOD OF CONTROLLING MEMORY SYSTEM
    • Publication number 20110173380
    • Publication date Jul 14, 2011
    • Kabushiki Kaisha Toshiba
    • Hirokuni Yano
    • G06 - COMPUTING CALCULATING COUNTING