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Hakan Altan
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New York, NY, US
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last 30 patents
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Patent Grant
Non-linear terahertz spectroscopy for defect density identification...
Patent number
7,459,687
Issue date
Dec 2, 2008
New Jersey Institute of Technology
John Francis Federici
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Non-Linear Terahertz Spectroscopy for Defect Density Identification...
Publication number
20070235650
Publication date
Oct 11, 2007
John Francis Federici
G01 - MEASURING TESTING