Ham-Ming Hsieh

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Hsin-Chu, TW

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Patents Grantslast 30 patents

Information Patent Grant
Method to predict and identify defocus wafers
- Patent number 7,301,604
- Issue date Nov 27, 2007
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chun-Hung Lin
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method to predict and identify defocus wafers
- Publication number 20050185170
- Publication date Aug 25, 2005
- Chun-Hung Lin
- G01 - MEASURING TESTING