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Hamed Kajbaf
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Sunnyvale, CA, US
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Patents Grants
last 30 patents
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Patent Grant
Using computer-aided design layout in scanning system
Patent number
10,325,057
Issue date
Jun 18, 2019
Amber Precision Instruments, Inc.
Giorgi Muchaidze
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Emission source microscopy for electromagnetic interference applica...
Patent number
9,618,554
Issue date
Apr 11, 2017
Amber Precision Instruments, Inc.
Hamed Kajbaf
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
USING COMPUTER-AIDED DESIGN LAYOUT IN SCANNING SYSTEM
Publication number
20170068771
Publication date
Mar 9, 2017
AMBER PRECISION INSTRUMENTS, INC.
Giorgi Muchaidze
G01 - MEASURING TESTING
Information
Patent Application
EMISSION SOURCE MICROSCOPY FOR ELECTROMAGNETIC INTERFERENCE APPLICA...
Publication number
20150177301
Publication date
Jun 25, 2015
AMBER PRECISION INSTRUMENTS, INC.
Hamed Kajbaf
G01 - MEASURING TESTING