Hamed Sadeghian Marnani

Person

's-Gravenhage, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Method of and system for performing subsurface imaging using vibrat...
- Patent number 12,169,187
- Issue date Dec 17, 2024
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Daniele Piras
- G01 - MEASURING TESTING
Information Patent Grant
Lithographic patterning method
- Patent number 11,977,337
- Issue date May 7, 2024
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Diederik Jan Maas
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Heterodyne scanning probe microscopy method and system
- Patent number 11,940,416
- Issue date Mar 26, 2024
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Hamed Sadeghian Marnani
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring damage of a substrate caused by an electron beam
- Patent number 11,774,381
- Issue date Oct 3, 2023
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Hamed Sadeghian Marnani
- G01 - MEASURING TESTING
Information Patent Grant
Method of positioning a carrier on a flat surface, and assembly of...
- Patent number 11,650,224
- Issue date May 16, 2023
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Hamed Sadeghian Marnani
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Atomic force microscopy cantilever, system and method
- Patent number 11,644,481
- Issue date May 9, 2023
- Nederlandse Organisatie voor toegepast-nataurwetenschappelijk onderzoek TNO
- Maarten Hubertus Van Es
- G01 - MEASURING TESTING
Information Patent Grant
Heterodyne scanning probe microscopy method and scanning probe micr...
- Patent number 11,635,448
- Issue date Apr 25, 2023
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Sri Ram Shankar Rajadurai
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope, scan head and method
- Patent number 11,592,460
- Issue date Feb 28, 2023
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Roelof Willem Herfst
- G01 - MEASURING TESTING
Information Patent Grant
Frequency tracking for subsurface atomic force microscopy
- Patent number 11,402,405
- Issue date Aug 2, 2022
- Nederlandse Oganisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Paul Louis Maria Joseph Van Neer
- G01 - MEASURING TESTING
Information Patent Grant
Subsurface atomic force microscopy with guided ultrasound waves
- Patent number 11,327,092
- Issue date May 10, 2022
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Daniele Piras
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscopy system for and method of mapping nanostru...
- Patent number 11,320,454
- Issue date May 3, 2022
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST-NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Hamed Sadeghian Marnani
- G01 - MEASURING TESTING
Information Patent Grant
Method, atomic force microscopy system and computer program product
- Patent number 11,289,367
- Issue date Mar 29, 2022
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Violeta Navarro Paredes
- G01 - MEASURING TESTING
Information Patent Grant
Method of and atomic force microscopy system for performing subsurf...
- Patent number 11,268,935
- Issue date Mar 8, 2022
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Daniele Piras
- G01 - MEASURING TESTING
Information Patent Grant
Distance sensor, alignment system and method
- Patent number 11,221,214
- Issue date Jan 11, 2022
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Hamed Sadeghian Marnani
- G01 - MEASURING TESTING
Information Patent Grant
Method of performing atomic force microscopy with an ultrasound tra...
- Patent number 11,067,597
- Issue date Jul 20, 2021
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST-NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Martinus Cornelius Johannes Maria Van Riel
- G01 - MEASURING TESTING
Information Patent Grant
Atomic force microscopy system, method for mapping one or more subs...
- Patent number 11,035,878
- Issue date Jun 15, 2021
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Laurent Fillinger
- G01 - MEASURING TESTING
Information Patent Grant
Method of and system for detecting structures on or below the surfa...
- Patent number 11,029,329
- Issue date Jun 8, 2021
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Hamed Sadeghian Marnani
- G01 - MEASURING TESTING
Information Patent Grant
Atomic force microscopy device, method and lithographic system
- Patent number 10,976,345
- Issue date Apr 13, 2021
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Abbas Mohtashami
- G01 - MEASURING TESTING
Information Patent Grant
Method of and system for performing detection on or characterizatio...
- Patent number 10,948,458
- Issue date Mar 16, 2021
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Hamed Sadeghian Marnani
- G01 - MEASURING TESTING
Information Patent Grant
Heterodyne atomic force microscopy device, method and lithographic...
- Patent number 10,942,200
- Issue date Mar 9, 2021
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Abbas Mohtashami
- G01 - MEASURING TESTING
Information Patent Grant
Method of determining an overlay error, method for manufacturing a...
- Patent number 10,935,568
- Issue date Mar 2, 2021
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Maarten Hubertus van Es
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for measuring and/or modifying surface features o...
- Patent number 10,908,179
- Issue date Feb 2, 2021
- NEDERLANDSK ORGANISATIE VOOR TOEGEPAST-NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Hamed Sadeghian Marnani
- G01 - MEASURING TESTING
Information Patent Grant
Method of and system for determining an overlay or alignment error...
- Patent number 10,859,925
- Issue date Dec 8, 2020
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Violeta Navarro Paredes
- G01 - MEASURING TESTING
Information Patent Grant
Thermal nanolithography method and system
- Patent number 10,852,641
- Issue date Dec 1, 2020
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Hamed Sadeghian Marnani
- G01 - MEASURING TESTING
Information Patent Grant
Method of and system for performing defect detection on or characte...
- Patent number 10,775,405
- Issue date Sep 15, 2020
- Nederlandse Organisatie voor toegepast-natuuurwetenschappelijk onderzoek TNO
- Hamed Sadeghian Marnani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of tuning parameter settings for performing acoustic scannin...
- Patent number 10,746,702
- Issue date Aug 18, 2020
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Hamed Sadeghian Marnani
- G01 - MEASURING TESTING
Information Patent Grant
Method of determining an overlay error, manufacturing method and sy...
- Patent number 10,712,674
- Issue date Jul 14, 2020
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST-NATUURWETENSCHAPPELUK ONDERZOEK TNO
- Stefan Kuiper
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of performing surface measurements on a surface of a sample,...
- Patent number 10,697,998
- Issue date Jun 30, 2020
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Hamed Sadeghian Marnani
- G01 - MEASURING TESTING
Information Patent Grant
Alignment system and method
- Patent number 10,663,874
- Issue date May 26, 2020
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Hamed Sadeghian Marnani
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Determining interaction forces in a dynamic mode AFM during imaging
- Patent number 10,578,643
- Issue date Mar 3, 2020
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Hamed Sadeghian Marnani
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ACTIVE DITHER BALANCING OF A MOTION STAGE FOR SCANNING PROBE MICROS...
- Publication number 20240393363
- Publication date Nov 28, 2024
- Nearfield Instruments B.V.
- Massoud Hemmasian Ettefagh
- G01 - MEASURING TESTING
Information Patent Application
POSITIONING SYSTEM AND METHOD
- Publication number 20240295583
- Publication date Sep 5, 2024
- Nearfield Instruments B.V.
- Hamed SADEGHIAN MARNANI
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF AND SYSTEM FOR REFURBISHING A PROBE FOR USE IN A SCANNING...
- Publication number 20240288468
- Publication date Aug 29, 2024
- Nearfield Instruments B.V.
- Hamed SADEGHIAN MARNANI
- G01 - MEASURING TESTING
Information Patent Application
LASER DIODE ARRANGEMENT, METHOD OF OPERATING A LASER DIODE AND SCAN...
- Publication number 20240275130
- Publication date Aug 15, 2024
- Nearfield Instruments B.V.
- Taras PISKUNOV
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR PERFORMING ATOMIC FORCE MICROSCOPY, INCLUDING A GRID PLA...
- Publication number 20240241151
- Publication date Jul 18, 2024
- Nearfield Instruments B.V.
- Hamed SADEGHIAN MARNANI
- G01 - MEASURING TESTING
Information Patent Application
FIDUCIAL MARKER DESIGN, FIDUCIAL MARKER, SCANNING PROBE MICROSCOPY...
- Publication number 20240210443
- Publication date Jun 27, 2024
- Nearfield Instruments B.V.
- Hamed SADEGHIAN MARNANI
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF CALIBRATING IN A SCANNING PROBE MICROSCOPY SYSTEM AN OPTI...
- Publication number 20240210442
- Publication date Jun 27, 2024
- Nearfield Instruments B.V.
- Taras PISKUNOV
- G01 - MEASURING TESTING
Information Patent Application
COMPACT OPTICAL MICROSCOPE, METROLOGY DEVICE COMPRISING THE OPTICAL...
- Publication number 20240184089
- Publication date Jun 6, 2024
- Nearfield Instruments B.V.
- Hamed SADEGHIAN MARNANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATED LANDING METHOD OF A SCANNING PROBE MICROSCOPY SYSTEM AND...
- Publication number 20240110939
- Publication date Apr 4, 2024
- Nearfield Instruments B.V.
- Hamed SADEGHIAN MARNANI
- G01 - MEASURING TESTING
Information Patent Application
CASSETTE FOR HOLDING A PROBE
- Publication number 20240027491
- Publication date Jan 25, 2024
- Nearfield Instruments B.V.
- Hamed SADEGHIAN MARNANI
- G01 - MEASURING TESTING
Information Patent Application
ALIGNMENT SYSTEM AND METHOD FOR ALIGNING AN OBJECT HAVING AN ALIGNM...
- Publication number 20240004321
- Publication date Jan 4, 2024
- Nearfield Instruments B.V.
- Hamed SADEGHIAN MARNANI
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
ARRANGEMENT FOR AND METHOD OF DETERMINING CANTILEVER DEFLECTION IN...
- Publication number 20230393169
- Publication date Dec 7, 2023
- Nearfield Instruments B.V.
- Hamed SADEGHIAN MARNANI
- G01 - MEASURING TESTING
Information Patent Application
A PROBE CASSETTE FOR STORING, TRANSPORTING AND HANDLING ONE OR MORE...
- Publication number 20230213552
- Publication date Jul 6, 2023
- Nearfield Instruments B.V.
- Johannes Gradus Martinus KOERS
- G01 - MEASURING TESTING
Information Patent Application
A PROBE CASSETTE AND METHOD FOR STORING, TRANSPORTING AND HANDLING...
- Publication number 20230213551
- Publication date Jul 6, 2023
- Nearfield Instruments B.V.
- Johannes Gradus Martinus KOERS
- G01 - MEASURING TESTING
Information Patent Application
HETERODYNE SCANNING PROBE MICROSCOPY METHOD AND SCANNING PROBE MICR...
- Publication number 20220229088
- Publication date Jul 21, 2022
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Sri Ram Shankar RAJADURAI
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE, SCAN HEAD AND METHOD
- Publication number 20220057430
- Publication date Feb 24, 2022
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Roelof Willem HERFST
- G01 - MEASURING TESTING
Information Patent Application
LITHOGRAPHIC PATTERNING METHOD
- Publication number 20220026816
- Publication date Jan 27, 2022
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Diederik Jan MAAS
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
ATOMIC FORCE MICROSCOPY CANTILEVER, SYSTEM AND METHOD
- Publication number 20220026464
- Publication date Jan 27, 2022
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Maarten Hubertus van Es
- G01 - MEASURING TESTING
Information Patent Application
FREQUENCY TRACKING FOR SUBSURFACE ATOMIC FORCE MICROSCOPY
- Publication number 20210389345
- Publication date Dec 16, 2021
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Paul Louis Maria Joseph VAN NEER
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING DAMAGE OF A SUBSTRATE CAUSED BY AN ELECTRON BEAM
- Publication number 20210333226
- Publication date Oct 28, 2021
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Hamed Sadeghian Marnani
- G01 - MEASURING TESTING
Information Patent Application
SUBSURFACE ATOMIC FORCE MICROSCOPY WITH GUIDED ULTRASOUND WAVES
- Publication number 20210109128
- Publication date Apr 15, 2021
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Daniele Piras
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHOD AND SYSTEM FOR AT LEAST SUBSURFACE CHARACTERIZATION OF A SAMPLE
- Publication number 20210003608
- Publication date Jan 7, 2021
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Hamed SADEGHIAN MARNANI
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF PERFORMING ATOMIC FORCE MICROSCOPY
- Publication number 20200348334
- Publication date Nov 5, 2020
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Martinus Cornelius Johannes Maria VAN RIEL
- G01 - MEASURING TESTING
Information Patent Application
ATOMIC FORCE MICROSCOPY SYSTEM, METHOD FOR MAPPING ONE OR MORE SUBS...
- Publication number 20200309816
- Publication date Oct 1, 2020
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Laurent FILLINGER
- G01 - MEASURING TESTING
Information Patent Application
ATOMIC FORCE MICROSCOPY CANTILEVER, SYSTEM AND METHOD
- Publication number 20200249255
- Publication date Aug 6, 2020
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Maarten Hubertus van Es
- G01 - MEASURING TESTING
Information Patent Application
METHOD, ATOMIC FORCE MICROSCOPY SYSTEM AND COMPUTER PROGRAM PRODUCT
- Publication number 20200227311
- Publication date Jul 16, 2020
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Violeta Navarro Paredes
- G01 - MEASURING TESTING
Information Patent Application
HETERODYNE ATOMIC FORCE MICROSCOPY DEVICE, METHOD AND LITHOGRAPHIC...
- Publication number 20200124635
- Publication date Apr 23, 2020
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST-NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Abbas Mohtashami
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF AND SYSTEM FOR PERFORMING SUBSURFACE IMAGING USING VIBRAT...
- Publication number 20200124571
- Publication date Apr 23, 2020
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Daniele Piras
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPY SYSTEM FOR AND METHOD OF MAPPING NANOSTRU...
- Publication number 20200116754
- Publication date Apr 16, 2020
- Hamed Sadeghian Marnani
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF POSITIONING A CARRIER ON A FLAT SURFACE, AND ASSEMBLY OF...
- Publication number 20200081034
- Publication date Mar 12, 2020
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Hamed Sadeghian Marnani
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...

Hamed Sadeghian Marnani

Person

Patents Grantslast 30 patents

Method of and system for performing subsurface imaging using vibrat...

Lithographic patterning method

Heterodyne scanning probe microscopy method and system

Method for measuring damage of a substrate caused by an electron beam

Method of positioning a carrier on a flat surface, and assembly of...

Atomic force microscopy cantilever, system and method

Heterodyne scanning probe microscopy method and scanning probe micr...

Scanning probe microscope, scan head and method

Frequency tracking for subsurface atomic force microscopy

Subsurface atomic force microscopy with guided ultrasound waves

Scanning probe microscopy system for and method of mapping nanostru...

Method, atomic force microscopy system and computer program product

Method of and atomic force microscopy system for performing subsurf...

Distance sensor, alignment system and method

Method of performing atomic force microscopy with an ultrasound tra...

Atomic force microscopy system, method for mapping one or more subs...

Method of and system for detecting structures on or below the surfa...

Atomic force microscopy device, method and lithographic system

Method of and system for performing detection on or characterizatio...

Heterodyne atomic force microscopy device, method and lithographic...

Method of determining an overlay error, method for manufacturing a...

Device and method for measuring and/or modifying surface features o...

Method of and system for determining an overlay or alignment error...

Thermal nanolithography method and system

Method of and system for performing defect detection on or characte...

Method of tuning parameter settings for performing acoustic scannin...

Method of determining an overlay error, manufacturing method and sy...

Method of performing surface measurements on a surface of a sample,...

Alignment system and method

Determining interaction forces in a dynamic mode AFM during imaging

Patents Applicationslast 30 patents

ACTIVE DITHER BALANCING OF A MOTION STAGE FOR SCANNING PROBE MICROS...

POSITIONING SYSTEM AND METHOD

METHOD OF AND SYSTEM FOR REFURBISHING A PROBE FOR USE IN A SCANNING...

LASER DIODE ARRANGEMENT, METHOD OF OPERATING A LASER DIODE AND SCAN...

SYSTEM FOR PERFORMING ATOMIC FORCE MICROSCOPY, INCLUDING A GRID PLA...

FIDUCIAL MARKER DESIGN, FIDUCIAL MARKER, SCANNING PROBE MICROSCOPY...

METHOD OF CALIBRATING IN A SCANNING PROBE MICROSCOPY SYSTEM AN OPTI...

COMPACT OPTICAL MICROSCOPE, METROLOGY DEVICE COMPRISING THE OPTICAL...

AUTOMATED LANDING METHOD OF A SCANNING PROBE MICROSCOPY SYSTEM AND...

CASSETTE FOR HOLDING A PROBE

ALIGNMENT SYSTEM AND METHOD FOR ALIGNING AN OBJECT HAVING AN ALIGNM...

ARRANGEMENT FOR AND METHOD OF DETERMINING CANTILEVER DEFLECTION IN...

A PROBE CASSETTE FOR STORING, TRANSPORTING AND HANDLING ONE OR MORE...

A PROBE CASSETTE AND METHOD FOR STORING, TRANSPORTING AND HANDLING...

HETERODYNE SCANNING PROBE MICROSCOPY METHOD AND SCANNING PROBE MICR...

SCANNING PROBE MICROSCOPE, SCAN HEAD AND METHOD

LITHOGRAPHIC PATTERNING METHOD

ATOMIC FORCE MICROSCOPY CANTILEVER, SYSTEM AND METHOD

FREQUENCY TRACKING FOR SUBSURFACE ATOMIC FORCE MICROSCOPY

METHOD FOR MEASURING DAMAGE OF A SUBSTRATE CAUSED BY AN ELECTRON BEAM

SUBSURFACE ATOMIC FORCE MICROSCOPY WITH GUIDED ULTRASOUND WAVES

METHOD AND SYSTEM FOR AT LEAST SUBSURFACE CHARACTERIZATION OF A SAMPLE

METHOD OF PERFORMING ATOMIC FORCE MICROSCOPY

ATOMIC FORCE MICROSCOPY SYSTEM, METHOD FOR MAPPING ONE OR MORE SUBS...

ATOMIC FORCE MICROSCOPY CANTILEVER, SYSTEM AND METHOD

METHOD, ATOMIC FORCE MICROSCOPY SYSTEM AND COMPUTER PROGRAM PRODUCT

HETERODYNE ATOMIC FORCE MICROSCOPY DEVICE, METHOD AND LITHOGRAPHIC...

METHOD OF AND SYSTEM FOR PERFORMING SUBSURFACE IMAGING USING VIBRAT...

SCANNING PROBE MICROSCOPY SYSTEM FOR AND METHOD OF MAPPING NANOSTRU...

METHOD OF POSITIONING A CARRIER ON A FLAT SURFACE, AND ASSEMBLY OF...