Han Cheng Ge

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Singapore, SG

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Patents Grantslast 30 patents

Information Patent Grant
Methods of inspecting a 3D object using 2D image processing
- Patent number 10,151,580
- Issue date Dec 11, 2018
- GENERIC POWER PTD LTD
- Kok Weng Wong
- G01 - MEASURING TESTING
Information Patent Grant
System and method for inspecting a wafer
- Patent number 9,863,889
- Issue date Jan 9, 2018
- Semiconductor Technologies & Instruments Pte Ltd
- Ajharali Amanullah
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multiple surface inspection system and method
- Patent number 7,869,021
- Issue date Jan 11, 2011
- ASTI Holdings Limited
- Ajharali Amanullah
- G01 - MEASURING TESTING
Information Patent Grant
Multiple surface inspection system and method
- Patent number 7,768,633
- Issue date Aug 3, 2010
- ASTI Holdings Limited
- Ajharali Amanullah
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS OF INSPECTING A 3D OBJECT USING 2D IMAGE PROCESSING
- Publication number 20170254639
- Publication date Sep 7, 2017
- Generic Power PTD LTD
- Kok Weng WONG
- G01 - MEASURING TESTING
Information Patent Application
System and method for inspecting a wafer
- Publication number 20100188486
- Publication date Jul 29, 2010
- Semiconductor Technologies & Instruments Pte Ltd
- Ajharali Amanullah
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method for inspecting a wafer
- Publication number 20100188499
- Publication date Jul 29, 2010
- Semiconductor Technologies & Instruments Pte Ltd
- Ajharali Amanullah
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Multiple Surface Inspection System and Method
- Publication number 20090073426
- Publication date Mar 19, 2009
- Ajharali Amanullah
- G01 - MEASURING TESTING
Information Patent Application
Multiple surface inspection system and method
- Publication number 20080246958
- Publication date Oct 9, 2008
- Ajharali Amanullah
- G01 - MEASURING TESTING