Han HAITJEMA

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for inner diameter measurement of transparent...
- Patent number 10,458,779
- Issue date Oct 29, 2019
- Mitutoyo Corporation
- Han Haitjema
- G01 - MEASURING TESTING
Information Patent Grant
Interference measuring device and method of measurement using the s...
- Patent number 10,024,648
- Issue date Jul 17, 2018
- Mitutoyo Corporation
- Tatsuya Nagahama
- G01 - MEASURING TESTING
Information Patent Grant
Image sequence and evaluation method and system for structured illu...
- Patent number 9,568,304
- Issue date Feb 14, 2017
- Mitutoyo Corporation
- Han Haitjema
- G02 - OPTICS
Information Patent Grant
Method and apparatus for determining a property of a surface
- Patent number 9,103,651
- Issue date Aug 11, 2015
- Mitutoyo Corporation
- Han Haitjema
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR INNER DIAMETER MEASUREMENT OF TRANSPARENT...
- Publication number 20190271535
- Publication date Sep 5, 2019
- MITUTOYO CORPORATION
- Han HAITJEMA
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETER SYSTEM HAVING A CONTINUOUSLY VARIABLE BROADBAND REFL...
- Publication number 20180031415
- Publication date Feb 1, 2018
- MITUTOYO CORPORATION
- Han HAITJEMA
- G02 - OPTICS
Information Patent Application
INTERFERENCE MEASURING DEVICE AND METHOD OF MEASUREMENT USING THE S...
- Publication number 20170363411
- Publication date Dec 21, 2017
- Mitutoyo Corporation
- Tatsuya Nagahama
- G01 - MEASURING TESTING
Information Patent Application
IMAGE SEQUENCE AND EVALUATION METHOD AND SYSTEM FOR STRUCTURED ILLU...
- Publication number 20150219441
- Publication date Aug 6, 2015
- MITUTOYO CORPORATION
- Han HAITJEMA
- G02 - OPTICS
Information Patent Application
INTERFEROMETER SYSTEM AND METHOD TO GENERATE AN INTERFERENCE SIGNAL...
- Publication number 20140362383
- Publication date Dec 11, 2014
- MITUTOYO CORPORATION
- Han HAITJEMA
- G02 - OPTICS
Information Patent Application
METHOD AND APPARATUS FOR DETERMINING A PROPERTY OF A SURFACE
- Publication number 20130335747
- Publication date Dec 19, 2013
- Han HAITJEMA
- G01 - MEASURING TESTING