Hanaul Noh

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Paldal-gu, KR

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Patents Grantslast 30 patents

Information Patent Grant
Scanning probe microscope with drift compensation
- Patent number 8,402,560
- Issue date Mar 19, 2013
- Park Systems Corp.
- Sang-il Park
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
SCANNING PROBE MICROSCOPE WITH DRIFT COMPENSATION
- Publication number 20110277192
- Publication date Nov 10, 2011
- Sang-Il PARK
- G01 - MEASURING TESTING