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Hani S. Attalla

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  • Boise, ID, US
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Patents Grantslast 30 patents

  • Information Patent Grant

    Isolation circuit
    • Patent number 8,624,615
    • Issue date Jan 7, 2014
    • Micron Technology, Inc.
    • Hani S. Attalla
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Isolation circuit
    • Patent number 8,004,297
    • Issue date Aug 23, 2011
    • Micron Technology, Inc.
    • Hani S. Attalla
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Isolation circuit
    • Patent number 7,541,825
    • Issue date Jun 2, 2009
    • Micron Technology, Inc.
    • Hani S. Attalla
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Method and system for stressing semiconductor wafers during burn-in
    • Patent number 7,274,201
    • Issue date Sep 25, 2007
    • Micron Technology, Inc.
    • Hani S. Attalla
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    ISOLATION CIRCUIT
    • Publication number 20120001680
    • Publication date Jan 5, 2012
    • Micron Technology, Inc.
    • Hani S. Attalla
    • G01 - MEASURING TESTING
  • Information Patent Application

    ISOLATION CIRCUIT
    • Publication number 20090212810
    • Publication date Aug 27, 2009
    • Micron Technology, Inc.
    • Hani S. Attalla
    • G01 - MEASURING TESTING
  • Information Patent Application

    Isolation circuit
    • Publication number 20080191728
    • Publication date Aug 14, 2008
    • Micron Technology, Inc.
    • Hani S. Attalla
    • G01 - MEASURING TESTING
  • Information Patent Application

    Method and system for stressing semiconductor wafers during burn-in
    • Publication number 20060261836
    • Publication date Nov 23, 2006
    • Hani S. Attalla
    • G01 - MEASURING TESTING