Hannes LOFERER

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Ortenburg, DE

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Patents Grantslast 30 patents

Information Patent Grant
Method and device for optically measuring the surface of a measurem...
- Patent number 11,125,550
- Issue date Sep 21, 2021
- Micro-Epsilon Messtechnik GmbH & Co. KG
- Hannes Loferer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Reference plate and method for calibrating and/or checking a deflec...
- Patent number 11,092,432
- Issue date Aug 17, 2021
- Micro-Epsilon Messtechnik GmbH & Co. KG
- Stephan Zweckinger
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND MEASUREMENT SYSTEM FOR CARRYING OUT AND/OR DISPLAYING A...
- Publication number 20240241623
- Publication date Jul 18, 2024
- MICRO-EPSILON MESSTECHNIK GMBH & CO. KG
- Hannes LOFERER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND DEVICE FOR OPTICALLY MEASURING THE SURFACE OF A MEASUREM...
- Publication number 20210364277
- Publication date Nov 25, 2021
- MICRO-EPSILON MESSTECHNIK GMBH & CO. KG
- Hannes LOFERER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND DEVICE FOR OPTICALLY MEASURING THE SURFACE OF A MEASUREM...
- Publication number 20200158498
- Publication date May 21, 2020
- MICRO-EPSILON MESSTECHNIK GMBH & CO. KG
- Hannes LOFERER
- G01 - MEASURING TESTING
Information Patent Application
REFERENCE PLATE AND METHOD FOR CALIBRATING AND/OR CHECKING A DEFLEC...
- Publication number 20190265026
- Publication date Aug 29, 2019
- MICRO-EPSILON MESSTECHNIK GMBH & CO. KG
- Stephan ZWECKINGER
- G01 - MEASURING TESTING