Hanno Sebastian von Harrach

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Eindhoven, NL

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Patents Grantslast 30 patents

Information Patent Grant
Mounting structures for multi-detector electron microscopes
- Patent number 8,993,963
- Issue date Mar 31, 2015
- FEI Company
- Hanno Sebastian von Harrach
- G01 - MEASURING TESTING
Information Patent Grant
X-ray detector for electron microscope
- Patent number 8,592,764
- Issue date Nov 26, 2013
- FEI Company
- Hanno Sebastian von Harrach
- G01 - MEASURING TESTING
Information Patent Grant
X-ray detector for electron microscope
- Patent number 8,410,439
- Issue date Apr 2, 2013
- PEI Company
- Hanno Sebastian Von Harrach
- G01 - MEASURING TESTING
Information Patent Grant
X-ray detector for electron microscope
- Patent number 8,080,791
- Issue date Dec 20, 2011
- FEI Company
- Hanno Sebastian von Harrach
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Mounting structures for multi-detector electron microscopes
- Publication number 20140319347
- Publication date Oct 30, 2014
- Hanno Sebastian von Harrach
- G01 - MEASURING TESTING
Information Patent Application
X-ray Detector for Electron Microscope
- Publication number 20140077080
- Publication date Mar 20, 2014
- FEI Company
- Hanno Sebastian von Harrach
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DETECTOR FOR ELECTRON MICROSCOPE
- Publication number 20130240731
- Publication date Sep 19, 2013
- FEI Company
- Hanno Sebastian von Harrach
- G01 - MEASURING TESTING
Information Patent Application
X-ray Detector for Electron Microscope
- Publication number 20120074333
- Publication date Mar 29, 2012
- FEI Company
- Hanno Sebastian von Harrach
- G01 - MEASURING TESTING
Information Patent Application
Method of expeditiously using a focused-beam apparatus to extract s...
- Publication number 20050054115
- Publication date Mar 10, 2005
- FEI Company
- Hanno Sebastian Von Harrach
- G01 - MEASURING TESTING