Hans A.R. Manhaeve

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Bruges, BE

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Patents Grantslast 30 patents

Information Patent Grant
Method for detecting faults in electronic devices, based on quiesce...
- Patent number 7,315,974
- Issue date Jan 1, 2008
- Q-Star Test N.V.
- Hans Manhaeve
- G01 - MEASURING TESTING
Information Patent Grant
Device for monitoring quiescent current of an electronic device
- Patent number 7,315,180
- Issue date Jan 1, 2008
- Q-Star Test N.V.
- Hans Manhaeve
- G01 - MEASURING TESTING
Information Patent Grant
Device for monitoring quiescent current of an electronic device
- Patent number 6,927,592
- Issue date Aug 9, 2005
- Q-Star Test N.V.
- Hans Manhaeve
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for testing supply connections
- Patent number 6,531,885
- Issue date Mar 11, 2003
- Interuniversitair Micro-Elektronica Centrum (IMEC vzw)
- Hans Manhaeve
- G01 - MEASURING TESTING
Information Patent Grant
High resolution (quiescent) supply current system (IDD monitor)
- Patent number 6,441,633
- Issue date Aug 27, 2002
- Interuniversitair Micro-Elektronica Centrum
- Hans Manhaeve
- G01 - MEASURING TESTING
Information Patent Grant
High resolution (quiescent) supply current system (IDD monitor)
- Patent number 6,118,293
- Issue date Sep 12, 2000
- Hans Manhaeve
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROGRAMMABLE TEST STRUCTURE FOR CHARACTERIZATION OF INTEGRATED CIRC...
- Publication number 20160161548
- Publication date Jun 9, 2016
- RIDGETOP GROUP, INC.
- Esko O. Mikkola
- G01 - MEASURING TESTING
Information Patent Application
Device for monitoring quiescent current of an electronic device
- Publication number 20050156619
- Publication date Jul 21, 2005
- Q-Star Test N.V.
- Hans Manhaeve
- G01 - MEASURING TESTING
Information Patent Application
Device for monitoring quiescent current of an electronic device
- Publication number 20040046576
- Publication date Mar 11, 2004
- Q-Star Test N.V.
- Hans Manhaeve
- G01 - MEASURING TESTING
Information Patent Application
Method for detecting faults in electronic devices, based on quiesce...
- Publication number 20040006731
- Publication date Jan 8, 2004
- Q-Star Test N.V.
- Hans Manhaeve
- G01 - MEASURING TESTING