Hans-Artur Bosser

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Breidenbach, DE

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for calibration of an optoelectronic sensor an...
- Patent number 7,265,343
- Issue date Sep 4, 2007
- Vistec Semiconductor Systems GmbH
- Hans-Arthur Bosser
- G01 - MEASURING TESTING
Information Patent Grant
Illumination apparatus for an optical system and microscope
- Patent number 7,262,909
- Issue date Aug 28, 2007
- Leica Microsystems CMS GmbH
- Hans-Artur Bösser
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Illumination apparatus for an optical system and microscope
- Publication number 20040179363
- Publication date Sep 16, 2004
- Leica Microsystems Semiconductor GmbH
- Hans-Artur Bosser
- G02 - OPTICS
Information Patent Application
Apparatus and Method for Calibration of an Optoelectronic Sensor an...
- Publication number 20040108448
- Publication date Jun 10, 2004
- Leica Microsystems Semiconductor GmbH
- Hans-Artur Bosser
- G01 - MEASURING TESTING
Information Patent Application
Method for automatic determination of optical parameters of a layer...
- Publication number 20040027580
- Publication date Feb 12, 2004
- Hans-Artur Bosser
- G01 - MEASURING TESTING