Hans-Christoph Ostendorf

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Munchen, DE

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Patents Grantslast 30 patents

Information Patent Grant
Test apparatus and method for testing a circuit unit
- Patent number 7,574,643
- Issue date Aug 11, 2009
- Infineon Technologies AG
- Stefan Gollmer
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for calibrating a test system for an integrate...
- Patent number 7,206,985
- Issue date Apr 17, 2007
- Infineon Technologies AG
- Hans-Christoph Ostendorf
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for testing wafers to be tested and calibration apparatus
- Patent number 6,897,646
- Issue date May 24, 2005
- Infineon Technologies AG
- Thomas Grebner
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Test apparatus and method for testing a circuit unit
- Publication number 20060202706
- Publication date Sep 14, 2006
- Infineon Technologies AG
- Stefan Gollmer
- G01 - MEASURING TESTING
Information Patent Application
Electronic circuit
- Publication number 20060120199
- Publication date Jun 8, 2006
- Carsten Ohlhoff
- G11 - INFORMATION STORAGE
Information Patent Application
Method for testing wafers to be tested and calibration apparatus
- Publication number 20030076126
- Publication date Apr 24, 2003
- Thomas Grebner
- G01 - MEASURING TESTING