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Hans de Waal
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Newfoundland, NJ, US
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last 30 patents
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Patent Grant
Sampling end for fiber optic probe
Patent number
6,879,741
Issue date
Apr 12, 2005
C Technologies, Inc
Mark Salerno
G01 - MEASURING TESTING
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Patent Grant
Force-measuring apparatus, particularly a weighing cell II
Patent number
6,367,338
Issue date
Apr 9, 2002
Mettler-Toledo GmbH
Luzi Hess
G01 - MEASURING TESTING