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Hans-Georg Wiedemann
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Staefa, CH
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last 30 patents
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Patent Grant
Differential thermal analysis system including dynamic mechanical a...
Patent number
6,146,013
Issue date
Nov 14, 2000
Mettler-Toledo GmbH
Thomas Huetter
G01 - MEASURING TESTING
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Patent Grant
Method and apparatus for performing single differential thermal ana...
Patent number
5,788,373
Issue date
Aug 4, 1998
Mettler-Toledo GmbH
Thomas Huetter
G01 - MEASURING TESTING