Hans-Guenter Zimmer

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Reute, DE

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Patents Grantslast 30 patents

Information Patent Grant
Bonding contact area on a semiconductor substrate
- Patent number 9,064,707
- Issue date Jun 23, 2015
- Micronas GmbH
- Hans-Guenter Zimmer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Manufacture of defect cards for semiconductor dies
- Patent number 8,143,076
- Issue date Mar 27, 2012
- Micronas GmbH
- Hans-Guenter Zimmer
- G01 - MEASURING TESTING
Information Patent Grant
Procedure for measuring the concentration of a gas
- Patent number 8,056,394
- Issue date Nov 15, 2011
- Micronas GmbH
- Heinz-Peter Frerichs
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
BONDING CONTACT AREA ON A SEMICONDUCTOR SUBSTRATE
- Publication number 20130062779
- Publication date Mar 14, 2013
- Hans-Guenter Zimmer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Procedure for Measuring the Concentration of a Gas
- Publication number 20090272175
- Publication date Nov 5, 2009
- Micronas GmbH
- Heinz-Peter Frerichs
- G01 - MEASURING TESTING