Hans Heissenstein

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Wiesenttal, DE

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Patents Grantslast 30 patents

Information Patent Grant
Method for examination of a sample by means of the lock-in thermogr...
- Patent number 10,761,039
- Issue date Sep 1, 2020
- DCG Systems GmbH
- Hans Heissenstein
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for the examination of a sample by means of therm...
- Patent number 9,905,014
- Issue date Feb 27, 2018
- FEI EFA, Inc.
- Hans Heissenstein
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR EXAMINATION OF A SAMPLE BY MEANS OF THE LOCK-IN THERMOGR...
- Publication number 20150355118
- Publication date Dec 10, 2015
- DCG Systems GmbH
- Hans Heissenstein
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR THE EXAMINATION OF A SAMPLE BY MEANS OF THERM...
- Publication number 20150339830
- Publication date Nov 26, 2015
- Thermosensorik GmbH
- Hans Heissenstein
- G01 - MEASURING TESTING