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Hans-Juergen Engelmann
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Dresden, DE
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Patents Grants
last 30 patents
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Patent Grant
Method for reconstructing two-dimensional chemical maps from electr...
Patent number
8,442,357
Issue date
May 14, 2013
GLOBALFOUNDRIES Inc.
Pavel Potapov
G01 - MEASURING TESTING
Information
Patent Grant
Technique for forming embedded metal lines having increased resista...
Patent number
8,039,395
Issue date
Oct 18, 2011
GLOBALFOUNDRIES Inc.
Moritz-Andreas Meyer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Metal line having an increased resistance to electromigration along...
Patent number
7,183,629
Issue date
Feb 27, 2007
Advanced Micro Devices, Inc.
Hans-Juergen Engelmann
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of sample preparation for electron microscopy
Patent number
6,303,399
Issue date
Oct 16, 2001
Advanced Micro Devices Inc.
Hans-Juergen Engelmann
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD FOR RECONSTRUCTING TWO-DIMENSIONAL CHEMICAL MAPS FROM ELECTR...
Publication number
20120237138
Publication date
Sep 20, 2012
GLOBALFOUNDRIES INC.
Pavel Potapov
G01 - MEASURING TESTING
Information
Patent Application
TRANSISTOR HAVING A STRAINED CHANNEL REGION CAUSED BY HYDROGEN-INDU...
Publication number
20100025742
Publication date
Feb 4, 2010
Sven Beyer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Technique for forming embedded metal lines having increased resista...
Publication number
20050161817
Publication date
Jul 28, 2005
Moritz-Andreas Meyer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Metal line having an increased resistance to electromigration along...
Publication number
20050046031
Publication date
Mar 3, 2005
Hans-Juergen Engelmann
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for objective and accurate thickness measurement of thin fil...
Publication number
20030222215
Publication date
Dec 4, 2003
Quentin de Robillard
G01 - MEASURING TESTING