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Hans-Peter Diehl
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Constance, DE
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last 30 patents
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Patent Grant
Inspection arrangement and method for fluorescence-based inspection
Patent number
11,921,044
Issue date
Mar 5, 2024
BAUMER INSPECTION GMBH
Hans-Peter Diehl
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for the metrological detection of differences in...
Patent number
7,596,261
Issue date
Sep 29, 2009
Massen Machine Vision Systems GmbH
Hans-Peter Diehl
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for the optical inspection of a transparent protective layer...
Patent number
7,256,883
Issue date
Aug 14, 2007
Igor Detinkin
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
INSPECTION ARRANGEMENT AND METHOD FOR FLUORESCENCE-BASED INSPECTION
Publication number
20220334060
Publication date
Oct 20, 2022
Baumer Inspection GmbH
HANS-PETER DIEHL
G01 - MEASURING TESTING
Information
Patent Application
Method and system for the metrological detection of differences in...
Publication number
20060233437
Publication date
Oct 19, 2006
Massen Machine Vision Systems GmbH
Hans-Peter Diehl
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method for the optical inspection of a transparent protective layer...
Publication number
20060114463
Publication date
Jun 1, 2006
Robert Massen
Igor Detinkin
G01 - MEASURING TESTING