Hans Thielemans

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Rotselaar, BE

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Patents Grantslast 30 patents

Information Patent Grant
Measurement probe unit for metrology applications
- Patent number 10,267,629
- Issue date Apr 23, 2019
- Nikon Metrology NV
- Frank Thys
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM FOR MEASURING THE POSITION AND MOVEMENT OF AN OBJECT
- Publication number 20180135969
- Publication date May 17, 2018
- NIKON METROLOGY N.V.
- Geert Vandenhoudt
- G01 - MEASURING TESTING
Information Patent Application
PROJECTION SYSTEM
- Publication number 20150377606
- Publication date Dec 31, 2015
- NIKON METROLOGY N.V.
- Hans Thielemans
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR MEASURING THE POSITION AND MOVEMENT OF AN OBJECT
- Publication number 20140043622
- Publication date Feb 13, 2014
- NIKON METROLOGY N.V.
- Geert Vandenhoudt
- G01 - MEASURING TESTING