Hans-Werner Fink

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Richterswil, CH

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Patents Grantslast 30 patents

Information Patent Grant
Source for intense coherent electron pulses
- Patent number 5,654,548
- Issue date Aug 5, 1997
- International Business Machines Corporation
- Hans-Werner Fink
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Delta-phi microlens for low-energy particle beams
- Patent number 5,059,804
- Issue date Oct 22, 1991
- International Business Machines Corporation
- Hans-Werner Fink
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Low-voltage source for narrow electron/ion beams
- Patent number 4,954,711
- Issue date Sep 4, 1990
- International Business Machines Corporation
- Hans-Werner Fink
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of making self-aligned apertures
- Patent number 4,919,780
- Issue date Apr 24, 1990
- International Business Machines Corporation
- Hans-Werner Fink
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Atto-amperemeter
- Patent number 4,804,909
- Issue date Feb 14, 1989
- International Business Machines Corporation
- Hans-Werner Fink
- G01 - MEASURING TESTING